U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Surface-area pressure transducer and line-selection circuit for use therewith

Patent 4644801 Issued on February 24, 1987. Estimated Expiration Date: Icon_subject August 21, 2005. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3565195

Apparatus for the time-dependent measurement of physical quantities
Patent #: 4134063
Issued on: 01/09/1979
Inventor: Nicol ,   et al.

Matrix screening and grounding arrangement and method
Patent #: 4405917
Issued on: 09/20/1983
Inventor: Chai

Force sensing means and method of producing such sensing means
Patent #: 4437138
Issued on: 03/13/1984
Inventor: Nicol

Conformable tactile sensor
Patent #: 4526043
Issued on: 07/02/1985
Inventor: Boie ,   et al.

Layered capacitive sensor for detecting loads and load variations thereon Patent #: 4581677
Issued on: 04/08/1986
Inventor: Hruby ,   et al.

Inventor

Assignee

Application

No. 06/767891 filed on 08/21/1985

US Classes:

73/862.046, Transducer array (e.g., columns and rows)361/283.1, Pressure73/172, ORTHOPEDIC PRESSURE DISTRIBUTION73/862.626Inductance or capacitance sensor

Examiners

Primary: Ruehl, Charles A.

International Class

G01L 1/14 (20060101)

Foreign Application Priority Data

1984-08-21 IL

Abstract

A surface-area-pressure transducer comprises: at least one pair of electrode layers each including a plurality of electrically-conductive elements, the elements of one layer extending in spaced, crossing relationship to the elements of the other layer; and a compressively-deformable dielectric layer composed of fibers interposed between the two electrode layers to define therewith an array of capacitors whose capacitances are changed by the compression of said dielectric layer when subjected to pressure. Also described is a line-selector circuit for individually selecting each capacitor for measurement without electrical cross-talk from the other capacitors.

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