Patent References 3396193 Dual channel apparatus for detecting surface defects in elongate metallic members with liftoff compensation Method and apparatus for testing a metallic workpiece by inducing eddy currents therein Patent #: 4387338 InventorsAssigneeApplicationNo. 06/650667 filed on 09/13/1984US Classes:324/225, With compensation for test variable324/237, Material flaw testing331/109, Amplitude stabilization and control331/65WITH DEVICE RESPONSIVE TO EXTERNAL PHYSICAL CONDITIONExaminersPrimary: Karlsen, Ernest F.Assistant: Snow, Walter E. Attorney, Agent or FirmInternational ClassG01N 27/90 (20060101)Foreign Application Priority Data1981-03-27 GBAbstractAn eddy current crack detection system has an inductive probe coil forming part of an oscillatory circuit. The coil voltage is fed to a measuring device a change in amplitude of the coil voltage being used as an indication of a crack. In order to compensate for lift-off in the amplitude of the coil voltage, a control signal is generated related to the magnitude of lift-off, and controls the value of a variable damping resistor in the oscillatory circuit. | |