U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Rotating probe indicating the angle of intersection with a surface

Patent 4604574 Issued on August 5, 1986. Estimated Expiration Date: Icon_subject February 15, 2004. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

2747152

3109139

3381216

3542996

Method of ultrasonic echo flaw detection and device for effecting same
Patent #: 3978714
Issued on: 09/07/1976
Inventor: Shraiber ,   et al.

Method and apparatus for servo-controlling a rotating workpiece
Patent #: 4276503
Issued on: 06/30/1981
Inventor: Peiffert ,   et al.

Process and apparatus for automatically adjusting ultrasonic test heads
Patent #: 4282577
Issued on: 08/04/1981
Inventor: Abend ,   et al.

Method of welding corrugated metallic materials
Patent #: 4296306
Issued on: 10/20/1981
Inventor: Nomura ,   et al.

Method and apparatus for targetless wafer alignment
Patent #: 4328553
Issued on: 05/04/1982
Inventor: Fredriksen ,   et al.

Carriage mounted apparatus for detecting surface defects in flat surfaced metallic objects
Patent #: 4409549
Issued on: 10/11/1983
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Inventors

Application

No. 06/580505 filed on 02/15/1984

US Classes:

324/207.12, Compensation for measurement318/648, With inertial, direction or inclination measuring instrument318/653, Magnetic transducers324/222, Hysteresis or eddy current loss testing324/225, With compensation for test variable324/226, Combined700/195, Having particular measuring device (e.g., probe)702/151Angular position

Examiners

Primary: Strecker, Gerard R.

Attorney, Agent or Firm

International Classes

G01B 7/02 (20060101)
G01B 7/30 (20060101)

Abstract

The relative orientation of a probe and a surface is maintained by positioning a proximity sensor off-axis on the probe, rotating the probe, and using the signal from the probe to adjust the relative orientation in a feedback loop.

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