U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

MOS static ram with capacitively loaded gates to prevent alpha soft errors

Patent 4590508 Issued on May 20, 1986. Estimated Expiration Date: Icon_subject November 29, 2003. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3657614

Semiconductor integrated circuit with implanted resistor element in polycrystalline silicon layer
Patent #: 4110776
Issued on: 08/29/1978
Inventor: Rao ,   et al.

Radiation hard memory cell and array thereof
Patent #: 4130892
Issued on: 12/19/1978
Inventor: Gunckel, II ,   et al.

Field-effect transistor structure in multilevel polycrystalline silicon
Patent #: 4240097
Issued on: 12/16/1980
Inventor: Raymond, Jr.

Electrically alterable floating gate memory with self-aligned low-threshold series enhancement transistor Patent #: 4258378
Issued on: 03/24/1981
Inventor: Wall

Inventors

Assignee

Application

No. 06/555420 filed on 11/29/1983

US Classes:

257/379, Combined with passive components (e.g., resistors)257/297, With means for preventing charge leakage due to minority carrier generation (e.g., alpha generated soft error protection or "dark current" leakage protection)257/E23.115, Against alpha rays (EPO)257/E27.101, Load element being a resistor (EPO)365/154Flip-flop (electrical)

Examiners

Primary: Larkins, William D.

Attorney, Agent or Firm

International Classes

G11C 11/412 (20060101)
G11C 5/00 (20060101)
H01L 23/552 (20060101)
H01L 23/556 (20060101)
H01L 27/11 (20060101)

Foreign Application Priority Data

1980-01-29 JP

Abstract

A semiconductor device in which a logic information can be held stably without being influenced by ଱-rays, is disclosed. The major feature of the device resides in that a capacitor is provided at a control terminal of a transistor holding a logic information thereby to increase an effective capacitance of the control terminal.

Other References

  • Dingwall et al, 1978 IEEE Internat. Electron Dev. Meeting, Tech. Digest, pp. 193-197 (Dec. 3, 1978)
  • Koyanagi et al, 1978 IEEE IEDM Tech. Dig., pp. 348-351 (12-78)
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