Current-shunt system for known conductors
Patent 4584525 Issued on April 22, 1986. Estimated Expiration Date: 
April 22, 2003. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
April 22, 2003. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 720335 2362372 3037161 3617870 Method and apparatus for measuring current, especially useful in multi-ampere systems Probe and system for detecting probe dislodgement Patent #: 4295475 InventorsApplicationNo. 06/485789 filed on 04/18/1983US Classes:324/126, With coupling means (e.g., attenuator, shunt)324/105, Thermal (e.g., compensation)324/72.5Voltage probeExaminersPrimary: Levy, Stuart S.Assistant: Baker, Stephen M. Attorney, Agent or FirmInternational ClassesG01R 1/20 (20060101)G01R 1/00 (20060101) AbstractA system for measuring currents flowing through a conductor uses the current-carrying conductor itself as the measurement shunt. The voltage developed across the inherent resistance of a fixed length of current-carrying conductor is measured and scaled to provide a displayable voltage of magnitude equal to the magnitude of current flowing in the conductor. Compensation for conductor temperature rise can be utilized, as can a multimeter accommodating various conductor materials and/or sizes.Other References
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