Multi-layered thin film heat transfer gauge
Patent 4577976 Issued on March 25, 1986. Estimated Expiration Date: 
October 19, 2004. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
October 19, 2004. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3648516 3765238 Device sensitive to a temperature gradient and its application for constructing a thermal fluxmeter or solar sensor Patent #: 4382154 InventorsAssigneeApplicationNo. 06/662899 filed on 10/19/1984US Classes:374/29, HEAT FLUX MEASUREMENT374/30By differential temperature measurement along undisturbed thermal gradientExaminersPrimary: Frankfort, Charles E.Assistant: Will, Thomas B. Attorney, Agent or FirmInternational ClassG01N 25/18 (20060101)Foreign Application Priority Data1984-03-27 JPAbstractA pair of metallic thin films are attached to opposite surfaces of a heat resistive thin film, and the heat flux through the heat resistive thin film is determined by measuring the temperature gradient therein while using the metallic thin films as resistance thermometer elements.Other References
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