Pattern features extracting apparatus and method
Patent 4543660 Issued on September 24, 1985. Estimated Expiration Date: 
April 14, 2003. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
April 14, 2003. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3846752 3906446 Pattern processing system Similarity calculator comprising a buffer for a single input pattern feature vector to be pattern matched with reference patterns Patent #: 4319221 InventorAssigneeApplicationNo. 06/485061 filed on 04/14/1983US Classes:382/218, Comparator382/205, Local neighborhood operations (e.g., 3x3 kernel, window, or matrix operator)382/224, Classification382/276IMAGE TRANSFORMATION OR PREPROCESSINGExaminersPrimary: Boudreau, Leo H.Attorney, Agent or FirmInternational ClassG06K 9/80 (20060101)Foreign Application Priority Data1982-04-15 JPAbstractA plurality of different mask pattern data which are indicated by values obtained from Hermitte's polynomials of different degrees weighted by a Gaussian function are stored in mask memories, respectively. Each mask pattern data stored in each of the mask memories is convolved by a sum-of-product circuit together with unknown input pattern data. A plurality of extracted pattern feature data are stored in pattern feature memories. | |
