Method and apparatus for reconstruction of three-dimensional surfaces from interference fringes
Patent 4525858 Issued on June 25, 1985. Estimated Expiration Date: 
January 3, 2003. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
January 3, 2003. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3889107 Electro-optical system for correlating and integrating image data from frame-to-frame Patent #: 4396903 InventorsApplicationNo. 06/455076 filed on 01/03/1983US Classes:382/154, 3-D or stereo imaging analysis345/419, Three-dimension345/423, Tessellation345/426, Lighting/shading356/2, CONTOUR PLOTTING356/605, Moire382/180Region labeling (e.g., page description language)ExaminersPrimary: Boudreau, Leo H.Assistant: Mancuso, Joseph Attorney, Agent or FirmInternational ClassesG01B 11/25 (20060101)G01B 11/24 (20060101) AbstractA fully automatic method for rapidly and unambiguously interpreting fringe patterns, including those having branched fringes, is provided. The information from the fringe patterns processed by the method of the invention can be used in testing, surface characterization and inspection applications. Further processing of the information from the two-dimensional fringe patterns yields information from which the three-dimensional surface can be quantitatively reconstructed for further use such as for display, as in microscopy, or as input for computer-aided design and computer-aided manufacture. Apparatus for conducting the method of the invention is also provided.Other References
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