Dielectric measuring systems
Patent 4510436 Issued on April 9, 1985. Estimated Expiration Date: 
July 15, 2002. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
July 15, 2002. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3215931 3774237 3774238 Water depth measuring device Method and apparatus for measuring a component in a flow stream Patent #: 4266188 InventorAssigneeApplicationNo. 06/399126 filed on 07/15/1982US Classes:324/690, Including a probe type structure324/672, By comparison or difference circuit324/684, With compensation means73/304CCapacitativeExaminersPrimary: Krawczewicz, Stanley T.Assistant: Solis, Jose M. Attorney, Agent or FirmInternational ClassG01R 27/26 (20060101)AbstractA capacitive transducer which comprises a pair of joined-together thin-film capacitors and a fluid-impervious container. The container may be filled with a standard solution of known composition. One of the two thin-film capacitors is immersed in the standard solution inside the container while the other is situated outside the container. The entire transducer may be immersed in a sample, and the capacitance of the outside capacitor, which is dependent on the dielectric constant of the sample, may be compared with that of the inside capacitor after the standard solution has reached thermal equilibrium with the sample. | |
