Defect detecting method and apparatus
Patent 4492476 Issued on January 8, 1985. Estimated Expiration Date: 
February 10, 2002. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
February 10, 2002. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesForeign matter detecting device Method and apparatus for setup of inspection devices for glass bottles Patent #: 4378495 InventorAssigneeApplicationNo. 06/347745 filed on 02/10/1982US Classes:356/428, Of containers250/223B, Bottles348/127Of transparent container or content (e.g., bottle, jar, etc.)ExaminersPrimary: McGraw, Vincent P.Assistant: Turner, Samuel A. Attorney, Agent or FirmInternational ClassesG01N 21/88 (20060101)G01N 21/90 (20060101) Foreign Application Priority Data1981-02-20 JPAbstractIn a defect detecting method and apparatus, the image of a bottle under inspection, which is conveyed while being spun, is divided into picture elements arranged in a matrix form, signals representative of the picture elements are generated sequentially and repeatedly, and the signals of the picture elements, on the same imaginary line perpendicular to the central axis of the image, are compared with each other, and the result of the comparison is used to detect a defect such as a foreign matter or a scratch.Field of SearchOf containers | |
