Test contact resistance of dry circuit contacts
Patent 4491797 Issued on January 1, 1985. Estimated Expiration Date: 
June 1, 2002. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
June 1, 2002. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 2810109 3217243 3510760 3515982 3928795 Connector contact terminal contamination probe Patent #: 4232262 InventorAssigneeApplicationNo. 06/383598 filed on 06/01/1982US Classes:324/421, To evaluate contact resistance324/415ELECTROMECHANICAL SWITCHING DEVICEExaminersPrimary: Tokar, MichaelAttorney, Agent or FirmInternational ClassG01R 27/20 (20060101)AbstractIn the testing of dry circuit contacts, a constant current source is applied to the contacts. The open circuit voltage of the source is set to a predetermined maximum value and then the short circuit current at the contacts measured. If the current value is below a predetermined maximum value, the voltage of the source is increased to bring the short-circuit current to the predetermined value. The voltage drop across the contacts is then measured and the contact resistance calculated. This arrangement makes adjustments to take into account variations in the test circuit, such as different lead lengths and other variables, without subjecting the contacts at any time to an open circuit voltage or short circuit current above maximum values.Other References
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