Apparatus for measuring noise factor and available gain
Patent 4491783 Issued on January 1, 1985. Estimated Expiration Date: 
April 22, 2002. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
April 22, 2002. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3464006 3774113 3794999 3835378 InventorsAssigneeApplicationNo. 06/370916 filed on 04/22/1982US Classes:324/616, Gain or attenuation324/614, Signal to noise ratio or noise figure455/226.3Signal-to-noise ratioExaminersPrimary: Krawczewicz, Stanley T.Assistant: Solis, Jose M. Attorney, Agent or FirmInternational ClassesG01R 27/00 (20060101)G01R 29/26 (20060101) G01R 29/00 (20060101) G01R 27/28 (20060101) Foreign Application Priority Data1981-04-25 JPAbstractDisclosed is a noise factor and available gain measuring apparatus in which a first noise source is connected to a first port of a circulator through a device under test, a second noise source is connected to a third port of the circulator, and the second port of the circulator is connected to a noise measuring circuit through a variable attenuator. In the apparatus, the noise factor and available gain of the device under test are separately evaluated on the basis of a plurality of overall noise factors measured with parameters of an excess noise ratio of the second noise generator and a noise factor of a noise measuring circuit containing the variable attenuator. | |
