Test clip for electronic chips
Method and apparatus for contacting the lead of an article
Multiple contact electrical test probe assembly Patent #: 4177425
ApplicationNo. 06/325314 filed on 11/27/1981
US Classes:324/754, With probe elements307/89, ANTI-INDUCTION OR COUPLING TO OTHER SYSTEMS324/72.5, Voltage probe439/912WITH TESTING MEANS
ExaminersPrimary: Levy, Stuart S.
Attorney, Agent or Firm
International ClassG01R 1/073 (20060101)
AbstractDisclosed is an interface assembly for use in conjunction with a test contactor assembly for integrated circuit (IC) electronic devices and the like. The test contactor assembly has at least one row of flexible contacts that are each secured at a lower end to a base. A conductive plate is also secured to the base and extends in a generally parallel, closely spaced relationship to each row of contacts. The dimensions of the plate and its spacing from the associated contacts produce a distributed capacitance with respect to each contact in the row such that a fast-rising test signal launched in a contact encounters a generally "characteristic" or purely resistive impedance that is frequency independent. The interface assembly, which connects the test contactor assembly to a test circuit, has a contactor board secured to the base of the contactor assembly. A pattern of conductive stripes is carried on at least one face of the board. Elastomeric connectors with narrow, mutually spaced apart conductive filaments, each oriented generally transversely to the connector, electrically connect the stripes with the contacts and plates of the contactor assembly. The interface assembly is secured to the test contactor assembly to establish a unique electrical connection between each conductive stripe and an associated contact or plate. The contactor board can include an internal metallic layer that serves as a ground and provides a distributed capacitance for the conductive stripes.