Process and apparatus for locating short-circuits in multi-layer circuit boards
Sensing probe for determining location of conductive features
Integrated circuit test probe assembly Patent #: 4362991
ApplicationNo. 06/329688 filed on 12/11/1981
US Classes:324/72.5, Voltage probe324/757Probe contact enhancement
ExaminersPrimary: Strecker, Gerard R.
Attorney, Agent or Firm
International ClassesG01R 1/067 (20060101)
G01R 31/28 (20060101)
AbstractAn apparatus for automatically testing printed circuit boards on which the test points are locatable at row and column intersections of a grid is described. The apparatus has two bars mounted above the printed circuit board in parallel alignment with the columns of the possible test points. Each bar has a set of probe contacts depending therefrom which can be placed into contact with the test points on the printed circuit board located along a single column. The bars are movable relative to the printed circuit board and may be sequentially placed into contact with any selected pair of columns of possible test points. Test voltages are sequentially applied to selected pairs of the probe contacts, enabling the electrical characteristics between the pairs of test points on the printed circuit board to be measured. A micro-processor is used to control the testing sequence and in correlating the results.