U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Thin film deposition by sputtering

Patent 4415427 Issued on November 15, 1983. Estimated Expiration Date: Icon_subject September 30, 2002. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3530057

3878085

Planar magnetron sputtering method and apparatus
Patent #: 3956093
Issued on: 05/11/1976
Inventor: McLeod

Sputtering apparatus and methods using a magnetic field
Patent #: 4025410
Issued on: 05/24/1977
Inventor: Stewart

Device for cathodic sputtering at a high deposition rate
Patent #: 4094764
Issued on: 06/13/1978
Inventor: Boucher, et al.

Sputtering process and apparatus
Patent #: 4166018
Issued on: 08/28/1979
Inventor: Chapin

Planar magnetron sputtering device
Patent #: 4180450
Issued on: 12/25/1979
Inventor: Morrison, Jr.

Cathode for sputtering
Patent #: 4194962
Issued on: 03/25/1980
Inventor: Chambers ,   et al.

Method and apparatus for producing a variable intensity pattern of sputtering material on a substrate Patent #: 4303489
Issued on: 12/01/1981
Inventor: Morrison, Jr.

Inventors

Assignee

Application

No. 06/431957 filed on 09/30/1982

US Classes:

204/298.26, Plural diverse treatment stations, zones, or coating material source within single chamber204/192.15, Specified deposition material or use204/298.08, Specified power supply or matching network204/298.12, Specified target particulars204/298.13, Target composition204/298.19Planar magnetron

Examiners

Primary: Demers, Arthur P.

Attorney, Agent or Firm

International Classes

C23C 14/35 (20060101)
H01J 37/34 (20060101)
H01J 37/32 (20060101)

Abstract

The deposition of thin films is carried out by a co-sputtering cathode technique particularly suited for deposition of doped thin films on large area substrates. A relatively large planar magnetron sputtering apparatus having a rectangular (picture frame shaped) plasma region is provided to obtain efficient sputtering of the host material. A vacant center area defined by the plasma region is provided for diode sputtering of the dopant. In RF sputtering, co-excitation of the power source is desired to prevent RF mode beating.

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