Method and apparatus for pattern recognition and detection
Patent 4414685 Issued on November 8, 1983. Estimated Expiration Date: 
May 29, 2001. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
May 29, 2001. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3564498 3737855 3805035 3905045 Two-dimensional transform processor Patent #: 4293920 InventorApplicationNo. 06/268608 filed on 05/29/1981US Classes:382/257, Dilation or erosion (e.g., opening or closing)382/103, Target tracking or detecting382/303, Pipeline processing382/304, Parallel processing382/308Morphological operations (i.e., local neighborhood operations)ExaminersPrimary: Boudreau, Leo H.Attorney, Agent or FirmInternational ClassesG06K 9/56 (20060101)G06T 5/20 (20060101) G06K 9/54 (20060101) AbstractImage analyzing apparatus and methods are disclosed for analyzing 3-dimensional as well as 2-dimensional images. The pixels of the 3-D images may be represented by multivalued digital data signals which are analyzed in one or more programmable neighborhood transformation stages. In the preferred embodiment, each stage is programmed with selected contribution values associated with each pixel in the neighborhood. The values of the data signals for each pixel are modified by these contribution values and the maximum value thereof is selected as the transformation output of the stage. A series of dilation/erosion transformations may be used to transform the original image matrix in such a manner so as to locate the position and/or identify the shape of particular objects contained in the original image.Other References
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