Apparatus for reflectance measurement of fluorescent radiation and composite useful therein
Patent 4395126 Issued on July 26, 1983. Estimated Expiration Date: 
March 12, 2001. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
March 12, 2001. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3516744 Feature extraction system for extracting a predetermined feature from a signal Passive infrared alarm device Photometric apparatus and methods for counting the particulate components of blood Reflecting apparatus in an optical system Patent #: 4306762 InventorAssigneeApplicationNo. 06/242890 filed on 03/12/1981US Classes:356/417, Included with sample excitation250/228, Integrating sphere250/461.1, With ultraviolet source356/236Integrating spheresExaminersPrimary: Evans, F. L.Attorney, Agent or FirmInternational ClassesG02B 5/22 (20060101)G01N 21/64 (20060101) AbstractMethod and means useful in reflectance measurement is provided wherein radiation of one wavelength is separated from radiation of a different wavelength by the use of a composite of at least two components, one of which is absorptive of said one wavelength radiation and is highly transmissive of said other wavelength radiation, and the other of which is reflective of radiation of both of said wavelengths. The method and means are particularly adapted for use in fluorescent radiation measurement to prevent high intensity residual incident excitation radiation from interfering with measurement of the relatively low intensity fluorescent radiation.Other References
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