Method of and device for testing a digital memory
Variable function digital word generating, receiving and monitoring device
Portable circuit tester Patent #: 4108358
ApplicationNo. 06/176353 filed on 08/08/1980
US Classes:714/745, Determination of marginal operation limits714/720, Special test pattern (e.g., checkerboard, walking ones)714/723Error mapping or logging
ExaminersPrimary: Atkinson, Charles E.
Attorney, Agent or Firm
International ClassG11C 29/56 (20060101)
AbstractSemiconductor memory devices are tested by using a special purpose computer which uses simple test patterns to determine the weakest bits of the device and then tests only these relatively few "weak bits" and structurally and operationally adjacent bits using highly complex test patterns to determine if the device is functioning properly. This procedure considerably reduces testing time over that required using prior art techniques.