U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Non-contacting resistivity instrument with structurally related conductance and distance measuring transducers

Patent 4302721 Issued on November 24, 1981. Estimated Expiration Date: Icon_subject May 15, 1999. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

2640190

3067387

3312893

3890564

Inventors

Assignee

Application

No. 06/039303 filed on 05/15/1979

US Classes:

324/226, Combined324/236, Oscillator type414/935ASSOCIATED WITH SEMICONDUCTOR WAFER HANDLING

Examiners

Primary: Strecker, Gerard R.
Assistant: Snow, Walter E.

Attorney, Agent or Firm

International Classes

G01S 15/32 (20060101)
G01S 15/00 (20060101)
G01R 31/265 (20060101)
G01R 31/28 (20060101)
G01R 31/26 (20060101)
G01N 27/02 (20060101)

Abstract

An instrument for computing resistivity based upon measurements of thickness and conductance. A conductance transducer is a solenoid in an annular ferrite cup connected to a tank circuit for an eddy current measurement of conductance. Within the center of the annular ferrite cup concentric acoustic wave sending and receiving channels are disposed for making an acoustic pressure wave measurement which is used for a thickness measurement using two gauge heads, spaced on opposite sides of an article to be measured. Each gauge head contains identical conductance and thickness transducers. The thickness measurement is divided by the conductance measurement to derive resistivity.

Other References

  • Botsco, "Eddy-Sonic Test Method", 2/1968, Materials Evaluation, pp. 21-26
  • Poponiak et al., "Detecting Conductivity Type in Semiconductor Analysis", 6/1971, IBM Tech. Disc. Bull., vol. 14, No. 1, p. 100
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