Electromagnetic noncontacting measuring apparatus
Patent 4234844 Issued on November 18, 1980. Estimated Expiration Date: 
December 15, 1998. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
December 15, 1998. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References3810005 InventorAssigneeApplicationNo. 05/969985 filed on 12/15/1978US Classes:324/642, Where energy is reflected (e.g., reflectometry)324/632, Using particular field coupling type (e.g., fringing field)324/636, With a resonant cavity324/639Where energy is transmitted through a test substanceExaminersPrimary: Krawczewicz, Stanley T.Attorney, Agent or FirmInternational ClassesA61B 5/053 (20060101)G01N 22/00 (20060101) G01R 27/02 (20060101) G01R 27/04 (20060101) G01R 27/06 (20060101) G01N 22/02 (20060101) G01N 27/20 (20060101) AbstractA noncontacting apparatus and method for following the changes in impedance of a substance located within a specified investigation zone. A bidirectionally focused electromagnetic beam, having a pair of foci, is aimed with one of its foci located adjacent such a zone. A receiver located adjacent the other one of its foci is monitored for electrical changes therein, and such changes are interpreted as indications of impedance changes in the selected zone. | |
