Eddy current device for automatically testing the quality of elongated electrically conductive objects by non-destructive techniques
Patent 4209744 Issued on June 24, 1980. Estimated Expiration Date: 
March 27, 1998. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
March 27, 1998. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 2300999 3056681 3343079 3394303 3528003 3538433 3895290 Inventors
ApplicationNo. 05/889931 filed on 03/27/1978US Classes:324/241, Opposed induced voltage sensors324/240Material flaw testingExaminersPrimary: Rolinec, Rudolph V.Assistant: Snow, Walter E. Attorney, Agent or FirmInternational ClassG01N 27/90 (20060101)AbstractAn automatic eddy current inspection system for discrimination of defects in elongated parts made of conducting materials comprises an alternating current generator connected in series to an amplitude selector via a differential encircling eddy-current transducer and a detector. The amplitude selector has two selection levels. The system also comprises a signal analyzer with a controllable switch and the following counters: a counter for determining the length of long cracks; a minor defects counter; a major defects counter; and a counter for determining the length of tested parts. The outputs of the counters are connected to the inputs of a sorter having its outputs connected to quality grade indicators. The controllable switch of the signal analyzer has its control input connected to the output of the amplitude selector which corresponds to a higher selection level. The input of the counter for determining the length of long cracks is connected to the output of a long cracks detecting circuit which has three inputs. The first input of said circuit is connected to a "part length-code" transducer, while its second and third inputs are connected to the inputs of the amplitude selector. The input of the minor defects counter and the input of the major defects counter are connected to respective outputs of an inhibitor which has three inputs connected as follows: the first one is connected in series to the control circuit of the controllable switch of the signal analyzer; the second one is connected to the output of the amplitude selector which corresponds to a higher selection level; and the third one, control, is connected to the output of the long cracks detecting unit. The input of the counter for determining the length of tested parts is connected to the output of the "part length-code" transducer.Other References
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