Method of testing an electrical circuit Patent #: 3934199
ApplicationNo. 05/874761 filed on 02/03/1978
US Classes:324/751, Using electron beam probe324/501, Using radiant energy324/537, Of individual circuit component or element324/73.1PLURAL, AUTOMATICALLY SEQUENTIAL TESTS
ExaminersPrimary: Rolinec, Rudolph V.
Assistant: Karlsen, Ernest F.
Attorney, Agent or Firm
International ClassesG01R 31/28 (20060101)
G01R 31/306 (20060101)
AbstractA method of testing electronic networks in which an electron probe is moved from point to point in the network and a current of secondary electrons emitted in response to the impingement of the probe is converted to a signal denoting voltage or field strength at the various points. A scanning apparatus in which an electronic collector including grids in the path of the beam and an annular scintillator is described.