Binary patterned web inspection
Patent 4166541 Issued on September 4, 1979. Estimated Expiration Date: 
August 30, 1997. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
August 30, 1997. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3835332 Optical comparator system to separate unacceptable defects from acceptable edge aberrations Inspection tool Patent #: 4040745 InventorAssigneeApplicationNo. 05/829248 filed on 08/30/1977US Classes:209/587, Reflected from item101/484, Condition responsive209/598, Sensing contour of item having no missing parts250/559.44, Identifying marking, pattern, or indicia356/398, With object being compared and light beam moved relative to each other (e.g., scanning)356/431, Including transverse scanning702/40Radiant energy (e.g., X-ray, infrared, laser)ExaminersPrimary: Rolla, Joseph J.International ClassG06T 7/00 (20060101)AbstractAn electro-optical inspection system for a binary patterned web which automatically determines registration and the quality of subjects of inspection by comparison with a master pattern stored in the memory of a computer and then passes or rejects individual subjects of inspection depending on the outcome of the comparison effected. | |
