U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Light beam shape control in optical measuring apparatus

Patent 4007992 Issued on February 15, 1977. Estimated Expiration Date: Icon_subject February 15, 1994. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

2812685

3743428

3905705

Inventors

Assignee

Application

No. 582690 filed on 06/02/1975

US Classes:

356/640, Single beam scans entire width or diameter250/559.24, Transversal measurement (e.g., width, diameter, cross-sectional area)356/429, BY MONITORING OF WEBS OR THREAD356/430, For flaws or imperfections359/221Having planar rotating reflector with rotation axis in its plane

Examiners

Primary: Corbin, John K.
Assistant: Rosenberger, Richard A.

Attorney, Agent or Firm

Abstract

A narrow collimated light beam, such as a laser beam, is directed towards a mirror which is rotated to effect rotary planar scanning or sweeping of a lens constructed to convert the rotary scanning beam into a parallel scanning beam. An article to be measured is positioned in the path of the parallel scanning beam at generally the focal point of the lens, and interruptions of the parallel scanning beam, as produced by the article, are sensed by a photodetector. The photodetector controls transmission of pulses or signals to means for counting pulses produced by a high frequency generator so that the counted pulses correspond to the dimension of the article at the plane of the parallel scanning beam. In this invention a lens is positioned in the path of the light beam and changes a narrow substantially round light beam into an elongate or substantially flat light beam which is scanned across an object for measurement thereof. The greatest dimension of the light beam is substantially normal to the direction of scan movement. Thus, if there should be irregularities or small particles of foreign material upon the surface of the object or adjacent thereto, the entire light beam is not completely interrupted by such particles or by such irregularities. Thus, a light beam is received by the photodetector in accordance with the average dimension or contour of the object at the measured portion thereof. Thus, the dimension of the object is measured without consideration of small irregularities or small or minute particles of foreign material or the like which may be present upon or adjacent the object at the measured portion thereof.

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