Sheet material characteristic measuring, monitoring and controlling method and apparatus using data profile generated and evaluated by computer means
Patent 3936665 Issued on February 3, 1976. Estimated Expiration Date: 
February 3, 1993. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
February 3, 1993. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3307215 3510374 3552203 3610897 3626165 InventorAssigneeApplicationNo. 464947 filed on 04/29/1974US Classes:700/129, Profile analyzer or controller162/252, Automatic control702/170Thickness or widthExaminersPrimary: Ruggiero, JosephAttorney, Agent or FirmAbstractA sheet material characteristic monitoring apparatus is provided for use in processes involving the production and contouring of sheet material. In a preferred embodiment, the sheet material characteristic is measured at two or more stationary cross direction locations of the sheet. A digital computer computes a regression equation between the measured values of the sheet characteristic and their respective locations, which equation is evaluated between limits representing the sheet edges to provide a data profile comprising estimated values of the sheet characteristic across the width of the sheet. The data profile may be derived substantially instantaneously. The data profile may further be evaluated between limits representing one or more desired transverse dimensions of the sheet. | |
