|5754556||Semiconductor memory tester with hardware accelerators|
A semiconductor memory manufacturing system including a tester sub-system and a redundancy analysis sub-system. The manufacturing system includes a transfer circuit between the test sub-system and the redundancy analysis sub-system that reduces the number...
|5588115||Redundancy analyzer for automatic memory tester|
Memory test apparatus including a redundancy analyzer with a catch RAM transfer interface circuit receiving fault information for a plurality of regions of a memory under test simultaneously in parallel and transmitting the information for each region to ...