|7880490||Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same|
A wireless interface probe card includes a substrate member and a transmission member. The substrate member has a plurality of probe terminals arranged at a constant pitch. The probe terminals may directly contact a plurality of pads arranged at a constant pitch on ...
|7786721||Multilayer type test board assembly for high-precision inspection|
There is provided a multilayer type test board assembly for high-precision inspection. The multilayer test board assembly comprises: a plurality of test boards separated from each other according to their functions, having input/output signal terminals, and includin...
|7438563||Connector for testing a semiconductor package|
In one embodiment, a connector is made using a mixture of insulating silicone powder and conductive powder. The connector comprises a connector body formed from the insulating silicone powder and on or more preferably regularly arrayed conductive silicone members th...