A coaxial test probe employs a flexible inner conductor that buckles upon the application of an axial load is housed within a conductive outer sheath. The inner probe includes an insulating spacer which forms a recess applied to the protruding end of the ...
|4506158||Dual mode spectrometer test station|
A new spectrometer station for semiconductor wafers is provided that permits operation in both the reflective and absorption modes either simultaneously or sequentially while the wafer is in a horizontal position. The wafer is positioned in the station on...