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Inventor: Pramodchandran N. Variyam


Address: Plano, TX
No. of patents: 5
Last patent issue date: 12/16/2008

NumberTitleIssue Date
7466259Methods and apparatus to measure a voltage on an integrated circuit
Methods and apparatus to measure a voltage on an integrated circuit are disclosed. An example method to measure a voltage on an integrated circuit provides a reference signal to a first input of an encoder, provides a signal having a first voltage to a second input ...
12/16/2008
7259703Device for recording laser trim progress and for detecting laser beam misalignment
The device for detecting and tracking a status of a device under laser trim includes: a series connected string of trim tracking links; and a plurality of detecting devices wherein each detecting device is coupled in parallel with a corresponding trim tracking link....
08/21/2007
7006939Method and apparatus for low cost signature testing for analog and RF circuits
A low cost signature test for RF and analog circuits. A model is provided to predict one or more performance parameters characterizing a first electronic circuit produced by a manufacturing process subject to process variation from the output of one or more second e...
02/28/2006
6865500Method for testing analog circuits
The present disclosure relates to a method for testing a circuit having analog components. The method comprises performing a low-cost optimized test on the circuit by applying an optimized input stimulus to the circuit, capturing the circuit response to the input st...
03/08/2005
6661266All digital built-in self-test circuit for phase-locked loops
In general, a built-in self test circuit and method is provided that measures error in any periodic signal and, particularly, a Phase Lock Loop (PLL) output clock signal. The circuit includes a short-pulse generator that generates a short-pulse signal hav...
12/09/2003
 
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