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| Number | Title | Issue Date |
| 7466259 | Methods and apparatus to measure a voltage on an integrated circuit Methods and apparatus to measure a voltage on an integrated circuit are disclosed. An example method to measure a voltage on an integrated circuit provides a reference signal to a first input of an encoder, provides a signal having a first voltage to a second input ... | 12/16/2008 |
| 7259703 | Device for recording laser trim progress and for detecting laser beam misalignment The device for detecting and tracking a status of a device under laser trim includes: a series connected string of trim tracking links; and a plurality of detecting devices wherein each detecting device is coupled in parallel with a corresponding trim tracking link.... | 08/21/2007 |
| 7006939 | Method and apparatus for low cost signature testing for analog and RF circuits A low cost signature test for RF and analog circuits. A model is provided to predict one or more performance parameters characterizing a first electronic circuit produced by a manufacturing process subject to process variation from the output of one or more second e... | 02/28/2006 |
| 6865500 | Method for testing analog circuits The present disclosure relates to a method for testing a circuit having analog components. The method comprises performing a low-cost optimized test on the circuit by applying an optimized input stimulus to the circuit, capturing the circuit response to the input st... | 03/08/2005 |
| 6661266 | All digital built-in self-test circuit for phase-locked loops In general, a built-in self test circuit and method is provided that measures error in any periodic signal and, particularly, a Phase Lock Loop (PLL) output clock signal. The circuit includes a short-pulse generator that generates a short-pulse signal hav... | 12/09/2003 |