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Inventor: Jean-Jacques Florent


Address: Saint Germain De Joux, FR
No. of patents: 1
Last patent issue date: 05/23/1995

NumberTitleIssue Date
5418830Radiometric thickness measurement gage
Radiometric gage for contactless measurement of the surface density or the thickness of a flat product, includes: an X-radiation emitter, whose tube, is directed toward the flat product an X-radiation receiver, whose detector is disposed in order to receive X-...
05/23/1995
 
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