|8156357||Voltage-based memory size scaling in a data processing system|
A memory has bits that fail as power supply voltage is reduced to reduce power and/or increase endurance. The bits become properly functional when the power supply voltage is increased back to its original value. With the reduced voltage, portions of the memory that...
|7688656||Integrated circuit memory having dynamically adjustable read margin and method therefor|
A method for dynamically controlling sense amplifier differential margin of a memory during operation, in an integrated circuit, including a plurality of addressable units, is provided. The method includes setting the sense amplifier differential margin correspondin...
|5483170||Integrated circuit fault testing implementing voltage supply rail pulsing and corresponding instantaneous current response analysis|
A method and apparatus for detecting faults in digital, analog, and hybrid integrated circuits is disclosed. A single test vector employing bias voltage on input used in conjunction with pulsing the power supply rails is used to allow detection of the var...