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Inventor: Christoph T. KOCH


Address: Goeppingen, DE
No. of applications: 1
Last application issue date: 03/03/2011

Application No.Application TitleIssue Date
20110049363METHOD AND DEVICE FOR MEASURING ELECTRON DIFFRACTION OF A SAMPLE
The invention relates to a method and a device for measuring electron diffraction of a sample, including the steps of illuminating the sample with an incident electron beam which is deflected from a sample axis to hit the sample at an angle of incidence relative to the ...
03/03/2011
 
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