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Inventor: Nancy Tovey


Address: South Burlington, VT
No. of applications: 1
Last application issue date: 03/11/2010

Application No.Application TitleIssue Date
20100063610METHOD OF PROCESS MODULES PERFORMANCE MATCHING
A method and system employing said method for analyzing process module performance in semiconductor manufacturing. The method and system include process modules as part of a process tool. A process initiated in the process module includes steps. Each step includes speci...
03/11/2010
 
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