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Pillow with retractable umbrella
A pillow assembly having a supporting assembly and a retractable umbrella assembly that is easily transportable and allows a user to support his/her head while covering their face from sunlight.
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| Application No. | Application Title | Issue Date |
| 20100253379 | Method and Apparatus for Probing a Wafer A semiconductor wafer resting on a contact element has a spatially distributed force applied to its frontside and an equal and opposing force applied to its backside. The contact element comprises a solid immersion lens (SIL), and has an area less than the area of the w... | 10/07/2010 |
| 20100080445 | Constructing Variability Maps by Correlating Off-State Leakage Emission Images to Layout Information Improved techniques are disclosed for monitoring or sensing process variations in integrated circuit designs. Such techniques provide such improvements by constructing variability maps correlating leakage emission images to layout information. By way of example, a metho... | 04/01/2010 |
| 20080208507 | METHOD AND APPARATUS FOR DIAGNOSING BROKEN SCAN CHAIN BASED ON LEAKAGE LIGHT EMISSION A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices with u... | 08/28/2008 |
| 20080079448 | ENHANCED SIGNAL OBSERVABILITY FOR CIRCUIT ANALYSIS Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of inte... | 04/03/2008 |
| 20070265722 | METHOD FOR IMPROVED EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTEGRATED CIRCUIT DEVICES A method of modeling yield for semiconductor products includes determining expected faults for each of a plurality of library elements by running a critical area analysis on each of the library elements, and assessing, from the critical area analysis, an expected number... | 11/15/2007 |
| 20070098037 | Techniques for distributing power in electronic circuits and computer systems Techniques for enhancing thermal design of a system having a number of boundary values are provided. A method for such enhancement includes representing thermal response of the system to the boundary values, obtaining at least one constraining parameter, and determining... | 05/03/2007 |
| 20060039114 | Method and system for measuring temperature and power distributions of a device in a package A present invention provides real-time temperature and power mapping of fully operating electronic devices. The method utilizes infrared (IR) temperature imaging, while an IR-transparent coolant flows through a specially designed cell directly over the electronic device... | 02/23/2006 |
| 20060028219 | Enhanced signal observability for circuit analysis Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of inte... | 02/09/2006 |
| 20050218921 | METHOD AND APPLICATION OF PICA (PICOSECOND IMAGING CIRCUIT ANALYSIS) FOR HIGH CURRENT PULSED PHENOMENA A method, system and apparatus are provided for operating a Picosecond Imaging Circuit Analysis (PICA)/high current source system include applying pulses from a high current pulse source to a Device Under Test (DUT). A photosensor detects photon emissions from the DUT. ... | 10/06/2005 |
| 20050168228 | Method and apparatus for diagnosing broken scan chain based on leakage light emission A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices with u... | 08/04/2005 |
| 20050071100 | Method and apparatus for improved detection of multisynchronous signals title Disclosed are a method and system for processing timing information with respect to an electronic device. The method comprises the steps of generating a first set of responses from the device at a first frequency in response to a first timing signal, and generating a se... | 03/31/2005 |
| 20050062490 | Analysis methods of leakage current luminescence in CMOS circuits Disclosed are a method and system for analyzing leakage current luminescence in CMOS circuits. The method comprises the steps of collecting light emission data from each of a plurality of CMOS circuits, and separating the CMOS circuits into first and second groups. For ... | 03/24/2005 |
