U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Examiner: Nguyen, Tu


Primary examiner statistics: 211 patents; average approval time: 211 days
Assistant examiner statistics: 0 patents; average approval time: N/A

Patents as Primary Examiner (view all)

Patent No. Patent Title:
8441628 Apparatus for inspecting an illumination device
8436995 Method of optimising the sensitivity of a surface plasmon ellipso...
8432539 Graded-index multimode optical fiber
8432538 Measuring modal content of multi-moded fibers
8422016 Non-contact and contact color sensor device
8416401 Local dosimeter for measuring the ambient equivalent dose of phot...
8411261 System for determining the length of an optical fiber unwound fro...
8411260 Light monitor configured to tap portion of light signal from mid-...
8405824 Sensors, systems and methods for position sensing
8400637 Signal processing for optical computing system
8400626 Ambient light sensor
8395763 Method of testing a passive optical element
8395783 System metrology core
8395785 Hybrid sensor
8390824 Laser based focusing method
8390811 48-channel arrayed isosbestic wavelength detection system
8384886 Fiber optic building monitoring system
8384888 Mask defect measurement method, mask quality determination and me...
8379226 Optical position detection apparatus and display apparatus having...
8379209 Non-destructive inspection device for oxygen concentration in bag...
8379212 Plasmonic droplet, method and apparatus for preparing the same, d...
8379202 Method for detecting contaminants
8368901 Encoder
8368872 Method for determining planting ball number of camera module
8368899 Coiled evanescent optical sensor
8368889 Compact snapshot polarimetry camera
8363213 Method for detecting impurities on a surface
8358412 System and process for sorting biological particles in liquid flo...
8355130 Method for evaluating white color shielding degree, method for ma...
8355128 Polarization controller
8355127 GRIN lens array light projector and method
8351052 Method and device for reading out a topographic structure applied...
8351036 System for naturally adjusting the cross-sectional area of a beam...
8351048 Linear-carrier phase-mask interferometer
8351053 Apparatus and method for in situ testing of microscale and nanosc...
8345237 Optical information analyzing device and optical information anal...
8345241 Application of digital light processor in imaging ellipsometer an...
8339616 Method and apparatus for high-speed unconstrained three-dimension...
8339608 Method for detecting redispersion of beads
8339592 Apparatus for photo reduction of contaminants in blood and blood ...

Patents as Assistant Examiner

Patent No. Patent Title:
No patents.
 
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