U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Six-year-old Robert W. Patch granted a patent for a "toy truck".

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Examiner: Tu, Trinh L.


Primary examiner statistics: 161 patents; average approval time: 892 days
Assistant examiner statistics: 135 patents; average approval time: 825 days

Patents as Primary Examiner (view all)

Patent No. Patent Title:
6381726 Architecture for soft decision decoding of linear block error cor...
6260171 Digital data recording channel
6212663 Apparatus and method for recovery of quantization codes in a loss...
6185708 Maintenance free test system
6178533 Method and system for design verification
6175943 Apparatus for controlling addresses of symbol data for error corr...
6170070 Test method of cache memory of multiprocessor system
6170076 Systematic punctured convolutional encoding method
6167540 Semiconductor memory device and redundant address selection metho...
6163869 Method of re-sending incorrectly transmitted data
6154861 Method and apparatus for built-in self-test of smart memories
6154863 Apparatus and method for testing non-componented printed circuit ...
6151693 Automated method of burn-in and endurance testing for embedded EE...
6151695 Test method of chips in a semiconductor wafer employing a test al...
6145114 Method of enhanced max-log-a posteriori probability processing
6138258 Circuit and method to prevent inadvertent test mode entry
6134688 Electronic device selectably operable as a sequential logic circu...
6115835 Method and apparatus for determining a set of tests for integrate...
6108811 Error-correcting decoder continuously adding flag signals to loca...
6105158 Screening for undetected errors in data transmission systems
6101627 Information processing system and logic LSI, detecting a fault in...
6098185 Header-formatted defective sector management system
6094741 Viterbi decoding apparatus, method for controlling slip state of ...
6088830 Method and apparatus for logic circuit speed detection
6088822 Integrated circuit with tap controller
6088819 Dynamic semiconductor memory device and method of testing the sam...
6085348 Error correction code encoder and decoder
6081917 Error correction apparatus and solid state image capturing appara...
6076177 Method and apparatus for testing a circuit module concurrently wi...
6073267 Semiconductor integrated circuit with error detecting circuit
6073260 Integrated circuit
6073259 Low cost CMOS tester with high channel density
6067646 Method and system for adaptive interleaving
6067653 Data decorder and data decoding method
6061818 Altering bit sequences to contain predetermined patterns
6058496 Self-timed AC CIO wrap method and apparatus
6052810 Differential driver circuit for use in automatic test equipment
6052808 Maintenance registers with Boundary Scan interface
6052809 Method for generating test patterns
6041427 Scan testable circuit arrangement

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
6227865 Screw-fixed rotary connector structure for vehicles
6186836 Modular connector having means for optimizing crosstalk character...
6135806 Junction between an intelligent contact terminal and a cable
6132266 Method of reducing crosstalk in connector for communication syste...
6061809 Process control interface system having triply redundant remote f...
5805605 Semiconductor integrated device
5802082 Method and device for measuring cell propagation time in ATM netw...
5799147 Computer recovery backup method
5796759 System and method for assessing medical risk
5793780 Method for monitoring transmission of digital data signals on two...
5784386 Fault tolerant synchronous clock distribution
5768285 Circuit for evaluating bit error rate performance of a data decod...
5764660 Processor independent error checking arrangement
5757810 Transmission link supervision in radiocommunication systems
5757824 Code error correction apparatus
5754759 Testing and monitoring of programmed devices
5751734 Decoding method and apparatus using trace deletion for Viterbi al...
5751745 Memory implemented error detection and correction code with addre...
5742625 Data storage system and parity generation method for data storage...
5729553 Semiconductor integrated circuit with a testable block
5726992 Circuit for and method of assessing an RDS signal
5724362 Apparatus and method employing a window reset for excessive bit e...
5719889 Programmable parity checking and comparison circuit
5712856 Method and apparatus for testing links between network switches
5712863 Randomizing encoder for digital data storage
5712855 Apparatus for testing and measuring electronic device and method ...
5706298 Method and apparatus for calculating the longitudinal redundancy ...
5703889 High efficiency coding signal processing apparatus with error ...
5704039 Mask programmable security system for a data processor and method...
5701315 Method and device for protecting the execution of linear sequence...
5701305 Error recovery in a network having cascaded hubs
5699364 Data communication system, apparatus and method which optimize th...
5699505 Method and system for automatically collecting diagnostic informa...
5696767 Bit error measuring apparatus
5691988 Method for measuring the sensitivities and interference wave prop...
5687178 Method and apparatus for testing a static RAM
5684945 System and method for maintaining performance data in a data proc...
5682388 Data testing
5682393 Pattern generator for cycle delay
5680541 Diagnosing method and apparatus
 
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