| Patent No. | Patent Title: |
| 8189195 | Inspection method and apparatus, lithographic apparatus, lithogra... |
| 8189180 | Optical fiber transmission line measurement apparatus and system |
| 8189196 | Self referencing LED detection system for spectroscopy applicatio... |
| 8189201 | Microscopy system, microscopy method, and a method of treating an... |
| 8189188 | Methods for determining enantiomeric purity with varying chiral a... |
| 8189190 | Remote chemical and elemental analysis by ultra fast spectroscopy |
| 8189194 | Direct illumination machine vision technique for processing semic... |
| 8189200 | Fiber optic interferometric sensor array with increased multiplex... |
| 8189203 | Reticle inspection systems and method |
| 8189204 | Surface wave enabled darkfield aperture |
| 8184293 | Methods and systems for chemical composition measurement and moni... |
| 8184284 | Laser-processed substrate for molecular diagnostics |
| 8184289 | Spectral colorimetric apparatus and color image forming apparatus... |
| 8179530 | Methods and systems for determining a critical dimension and over... |
| 8180143 | Method and system for estimating contact patterns |
| 8179529 | Alignment systems and methods |
| 8180156 | Method and device for machine-cutting a plate-shaped workpiece |
| 8179527 | Terahertz spectrometer |
| 8179525 | Mirror mounted inside filter block of a fluorescence microscope t... |
| 8174703 | Method for fabricating a sensor, a sensor, and a method for sensi... |
| 8175373 | Use of design information and defect image information in defect ... |
| 8174694 | Hyperspectral imaging systems |
| 8174707 | Optical element positioning apparatus |
| 8174686 | Focal position determining method, focal position determining app... |
| 8169604 | Parameter detection system |
| 8169623 | Optical apparatus and method for measuring the attitude of an obj... |
| 8169611 | Terahertz-infrared ellipsometer system, and method of use |
| 8169609 | System and method for improving performance of optical systems wi... |
| 8164747 | Apparatus, system and method for optical spectroscopic measuremen... |
| 8164748 | Widely-tuned semiconductor laser based gas liquid solid analysis ... |
| 8164751 | Optical system, method, and computer readable medium for determin... |
| 8164761 | Differential focus blade clearance probe and methods for using sa... |
| 8164755 | Method for determining an analyte in a sample |
| 8159658 | System and method for the automated analysis of samples |
| 8159662 | Systems and methods for remote unmanned raman spectroscopy |
| 8159678 | Method of measuring a deviation of an optical surface from a targ... |
| 8159664 | Apparatus for depth-selective Raman spectroscopy |
| 8159682 | Lens system |
| 8159656 | Method and apparatus for evaluating ultraviolet radiation protect... |
| 8159665 | Apparatus and methods for fluorescence subtraction in Raman spect... |
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