| Patent No. | Patent Title: |
| 7907276 | Film quality evaluation method, apparatus therefor, and productio... |
| 7460249 | Measuring instrument of polygon-mirror motor |
| 7460219 | Method for optically inspecting a wafer by sequentially illuminat... |
| 7460233 | Pass-line and tilt insensitive sensor |
| 7456960 | Particle counter with improved image sensor array |
| 7453568 | Fluorescence observation equipment |
| 7453569 | Method and apparatus for measuring particle motion using scattere... |
| 7450221 | Method and apparatus for detecting motion of an apparatus and for... |
| 7450250 | Method and apparatus for determining surface displacement based o... |
| 7440087 | Identifying optical fiber segments and determining characteristic... |
| 7440104 | Exposure system, test mask for monitoring polarization, and metho... |
| 7433025 | Automated protein crystallization imaging |
| 7423755 | Liquid measurement cell having a transparent partition therein |
| 7420665 | Optical detection device with reduced light throughput oscillatio... |
| 7414711 | Estimating optical transmission system penalties induced by polar... |
| 7411665 | Method for wavelength calibration of an optical measurement syste... |
| 7397556 | Method, apparatus, and computer program product for optimizing in... |
| 7365853 | Measuring method and measuring apparatus utilizing attenuated tot... |
| 7355726 | Linear variable reflector sensor and signal processor |
| 7355712 | Apparatus for measuring goniometric reflection property of sample |
| 7355706 | Particle detection system implemented with an immersed optical sy... |
| 7349104 | System and a method for three-dimensional imaging systems |
| 7345755 | Defect inspecting apparatus and defect inspection method |
| 7345757 | Inspection apparatus for pipelines |
| 7342670 | In-flight drop location verification system |
| 7339671 | Apparatus and method for monitoring biological cell culture |
| 7336359 | System and method for nonlinear optical null ellipsometry |
| 7324202 | Optical system |
| 7324201 | Yarn sensor |
| 7317520 | Method and apparatus for measuring brightness |
| 7315359 | Method for monitoring micro-lens curvature in-line |
| 7307715 | Method for the formation of a structure size measured value |
| 7301614 | Lens-refracting characteristic measuring apparatus |
| 7298484 | Dual-band sensor system utilizing a wavelength-selective beamspli... |
| 7298468 | Method and measuring device for contactless measurement of angles... |
| 7292320 | Laser crystallization apparatus and laser crystallization method |
| 7277188 | Systems and methods for implementing an interaction between a las... |
| 7271907 | Lithographic apparatus with two-dimensional alignment measurement... |
| 7242476 | Alignment measuring system and method of determining alignment in... |
| 7242463 | Method and device for detecting patterns on a substrate |
Quotables 
PatentStorm News
