U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Icon_funbox Quotables

"That the automobile has practically reached the limit of its development is suggested by the fact that during the past year no improvements of a radical nature have been introduced."

Scientific American ; Jan. 2 edition, 1909

Newsletter  PatentStorm News

Make the Most of Our Site

See this month's Top Inventors and Most Cited Patents.

Stay on top of the latest innovations by subscribing to an RSS feed.

Registered users: Manage your profile.

 

Examiner: Turner, Samuel A.


Primary examiner statistics: 1660 patents; average approval time: 1659 days
Assistant examiner statistics: 4 patents; average approval time: 852 days

Patents as Primary Examiner (view all)

Patent No. Patent Title:
7463350 Method and apparatus for detecting defects of a sample using a da...
7463361 Optical apparatus having a polarization splitter and multiple int...
7463360 Optical resonator gyro with integrated external cavity beam gener...
7460243 Measuring apparatus sensitive to rotational but not translational...
7453576 Method and system for calibrating a fiber optic gyroscope
7453577 Apparatus and method for inspecting a patterned part of a sample
7453575 Spectrometer including a plurality of spectrally diverse filters ...
7450245 Method and apparatus for measuring high-bandwidth electrical sign...
7446879 Solid-state gyrolaser stabilised by acousto-optic devices
7446881 System, apparatus, and method for determining temperature/thickne...
7446880 Method and apparatus for measuring and monitoring optical propert...
7443511 Integrated plane mirror and differential plane mirror interferome...
RE40551 Device for measuring translation, rotation or velocity via light ...
7440114 Off-axis paraboloid interferometric mirror with off focus illumin...
7433058 System and method for simultaneous 3D height measurements on mult...
7433049 Multi-axis interferometer with procedure and data processing for ...
7417741 Transmissive scanning delay line for optical coherence tomography
7411682 Real time high speed high resolution hyper-spectral imaging
7411683 Electric field measurement of optical waveforms
7408651 Method and system for wavefront measurements of an optical system
7408652 Device and method for the optical measurement of an optical syste...
7403291 Method of calculating two-dimensional wavefront aberration
7397569 Method and system for interferometric height measurement
7394547 Fiber-optic assay apparatus based on phase-shift interferometry
7388668 Phase sensitive heterodyne coherent anti-Stokes Raman scattering ...
7388670 LASER gyro readout signal stabilization in high vibration environ...
7388671 Polarizing cavity for RFOG and method for sensing rotation rate o...
7379191 Optical MEMS wavefront diagnostic transceivers and receiver
7375820 Interference measuring apparatus for detecting a plurality of sta...
7372576 System and method for generating beams of light using an anisotro...
7372574 System and method for stabilizing light sources in resonator gyro
7369247 Sensing coil assembly and method for attaching a sensing coil in ...
7369228 Compact spectrometer
7369245 Sensing coil assembly and method for attaching a sensing coil in ...
7369246 Method for winding sensing coils and sensing coil for fiber optic...
7362443 Optical gyro with free space resonator and method for sensing ine...
7359062 High speed spectral domain functional optical coherence tomograph...
7359064 Quantum positioning systems and methods
7355711 Method for detecting an end-point for polishing a material
7352472 Lithographic apparatus, device manufacturing method, and method f...

Patents as Assistant Examiner

Patent No. Patent Title:
7106450 Determination of a device signal response characteristic using mu...
4791460 Readout for a ring laser angular rate sensor
4498765 Processes for the remote measurement of the emissivity and/or the...
4492476 Defect detecting method and apparatus
 
Sign InRegister
Username  
Password   
forgot password?