U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Examiner: Punnoose, Roy M


Primary examiner statistics: 137 patents; average approval time: 147 days
Assistant examiner statistics: 0 patents; average approval time: N/A

Patents as Primary Examiner (view all)

Patent No. Patent Title:
8189177 Sample preparation apparatus and sample preparation method, and c...
8189895 Fused perfusion and functional 3D rotational angiography renderin...
8184273 Method of determining glucose concentration of a whole blood samp...
8184282 Method and system for defect detection using transmissive bright ...
8179536 Measurement of overlay offset in semiconductor processing
8179533 Sensing system and method for discriminating plant matter
8174697 Non-orthogonal particle detection systems and methods
8169601 Photoluminescent heat-shrinkable films
8169602 Automated document processing system and method
8169600 Surface mapping by optical manipulation of particles in relation ...
8169624 Transmissive dimension measuring device
8164760 Method and system for interrogating the thickness of a carbon lay...
8164757 Fabry-Perot type tunable filter and fabrication method thereof
8159680 Single-transducer, three-dimensional laser imaging system and met...
8159672 Sample investigating system and method of use
8160352 Surface inspection method and surface inspection apparatus
8154725 Line scanning measurement system
8154730 Arc flash detection method
8155430 Method of measurement of number of nonmetallic inclusions and cas...
8149412 Dynamic detection device based on surface plasmon resonance effec...
8139233 System and method for via structure measurement
8139215 Method for measuring polarization characteristics and measurement...
8139207 In vitro determination of analyte levels within body fluids
8134711 Device for remote sensing of vehicle emission
8134707 On-chip polarimetry for high-throughput screening of nanoliter an...
8135205 Rapid matching of noisy spectra or other signal patterns
8130377 Spectrophotometer system with modular 45/0 head
8125624 Automated document processing system and method
8126256 Device and method for analysis of signal characteristics with the...
8120760 Method and apparatus for separating a composite liquid into at le...
8121376 Diagnostic imaging support processing apparatus and diagnostic im...
8120766 Inspection apparatus
8121377 Method and tomography scanner for normalizing image data with res...
8121381 X-ray image processing apparatus and method
8115911 Image pickup apparatus
8116555 Vision inspection system and method for inspecting workpiece usin...
8111399 System and method for performing photothermal measurements and re...
8111892 Registration of CT image onto ultrasound images
8102531 Illumination source and non-invasive tissue sampling system
8094296 Optical inspection of surfaces open to different directions in a ...

Patents as Assistant Examiner

Patent No. Patent Title:
No patents.
 
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