| Patent No. | Patent Title: |
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| 8111082 | Test apparatus |
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| 8093885 | Residual magnetic flux determining apparatus |
| 8089264 | Voltage measuring circuit |
| 8089266 | Measuring induced currents on a CAN bus |
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| 8085059 | RF chip test method |
| 8081007 | Inspection apparatus and method for inspecting electric character... |
| 8076941 | Bottom system for geophysical survey (variants) |
| 8076926 | Rotary switch memory for digital multimeter |
| 8072209 | Position sensor with variable direction of magnetization and meth... |
| 8073219 | Nucleic acid analyzing apparatus |
| 8067952 | System-level ESD detection circuit |
| 8063629 | Method for processing sensor signals subject to an offset and sen... |
| 8063627 | Linear sensor having angular redirection and cable displacement |
| 8058891 | Delay lock loop circuit, timing generator, semiconductor test dev... |
| 8058890 | Test Handler |
| 8054096 | Device for measuring thickness and square resistivity of intercon... |
| 8054097 | Method and system for automatically managing probe mark shifts |
| 8054095 | Metalized elastomeric probe structure |
| 8049526 | Enhanced speed sorting of microprocessors at wafer test |
| 8049528 | Operation of an electrical drive system |
| 8049510 | Method for detecting a fault on a data line |
| 8044676 | IDDQ testing |
| 8040147 | Probe card cassette and probe card |
| 8030952 | Power sink for IC temperature control |
| 8018227 | Device and method for measuring and monitoring the level of liqui... |
| 8013626 | Test apparatus and driver circuit |
| 8013594 | Digital multimeter having hinged shield arrangement |
| 8004299 | Cantilever probe structure for a probe card assembly |
| 8004300 | Circuit board testing device with self aligning plates |
| 7990132 | Current sensor including an integrated circuit die including a fi... |
| 7990166 | Testing module for testing key buttons of portable electronic dev... |
| 7990168 | Probe card including a sub-plate with a main supporter and a sub-... |
| 7982485 | Semiconductor test device capable of modifying an amplitude of an... |
| 7982487 | System for multiple layer printed circuit board misregistration t... |
| 7982483 | Circuit and method for component communication |
| 7973550 | Semiconductor device test apparatus including interface unit and ... |
| 7973533 | In-circuit testing for integrity of solid-state switches |
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