U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Icon_funbox Bizarre Patents

Patent No. 5307162

Cloaking System Using Optoelectronically Controlled Camouflage

A Cloaking System designed to operate in the visible light spectrum, utilizes optoelectronics and/or photonic components to conceal an object within it.

Newsletter  PatentStorm News

Make the Most of Our Site

See this month's Top Inventors and Most Cited Patents.

Stay on top of the latest innovations by subscribing to an RSS feed.

Registered users: Manage your profile.

 

Examiner: Kim, Robert H.


Primary examiner statistics: 2161 patents; average approval time: 2160 days
Assistant examiner statistics: 320 patents; average approval time: 761 days

Patents as Primary Examiner (view all)

Patent No. Patent Title:
7425702 Charged particle beam apparatus
7411184 Microfluidic device comprising an electrospray nose
7399961 High throughput ion source with multiple ion sprayers and ion len...
7385189 Nanospray ionization device and method
7385187 Multi-reflecting time-of-flight mass spectrometer and method of u...
7385673 Immersion lithography with equalized pressure on at least project...
7378670 Shielding assembly for a semiconductor manufacturing apparatus an...
7375352 Photomask defect correction method employing a combined device of...
7375330 Charged particle beam equipment
7375344 Ion focussing and conveying device and a method of focussing and ...
7372026 System for repositioning a microfabricated cantilever
7368734 Ion beam measuring method and ion implanting apparatus
7368733 Contamination barrier and lithographic apparatus comprising same
7368738 Advanced pattern definition for particle-beam exposure
7368735 Charged beam drawing data creation method, charged beam drawing m...
7365345 Lithographic apparatus, radiation system and filter system
7365348 Adjusting device of an apparatus for generating a beam of charged...
7365349 EUV light source collector lifetime improvements
7361892 Method to increase low-energy beam current in irradiation system ...
7361898 Scanning electron microscope and CD measurement calibration stand...
7361941 Calibration standards and methods
7361917 Far-infrared generator for thermotherapy and method of far-infrar...
7358491 Method and apparatus for the depth-resolved characterization of a...
7358504 FAIMS apparatus and method for separating ions
7358484 Hyperthermal neutral beam source and method of operating
7355171 Method and apparatus for process monitoring and control
7355187 Position detection apparatus, position detection method, exposure...
7351965 Rotating excitation field in linear ion processing apparatus
7351961 Measuring cell for ion cyclotron resonance spectrometer
7351963 Multiple rod systems produced by wire erosion
7351960 Enhanced ion desolvation for an ion mobility spectrometry device
7350404 Scanning type probe microscope and probe moving control method th...
7348580 Particle beam processing apparatus and materials treatable using ...
7348143 Method of visualizing non-targeted metabolomic data generated fro...
7348582 Light source apparatus and exposure apparatus having the same
7348579 Arrangement for performing proton therapy
7348584 Infrared projector
7345287 Cooling module for charged particle beam column elements
7345275 Mass spectrometric based method for sample identification
7342241 Method and apparatus for electron-beam lithography

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
7411183 User customizable plate handling for MALDI mass spectrometry
6423958 Solid state imaging device and method of driving the same
6025911 Broadband ultrashort pulse measuring device using non-linear elec...
5917595 Fiber optic holding fixture for an optical interferometer
5870195 Method and system for determining the distance between optical fi...
5838450 Direct reticle to wafer alignment using fluorescence for integrat...
5835218 Moire interferometry system and method with extended imaging dept...
5831738 Apparatus and methods for viewing identification marks on semicon...
5825489 Mandrell based embedded planar fiber-optic interferometric acoust...
5825492 Method and apparatus for measuring retardation and birefringence
5818585 Fiber Bragg grating interrogation system with adaptive calibratio...
5815266 Sensing method and apparatus
5808740 Multiaxis distance measurement device for NC machine tools
5801831 Fabry-Perot spectrometer for detecting a spatially varying spectr...
5801833 Method of producing master and working pattern plates for etching...
5796483 Method and apparatus for position sensing
5790250 Apparatus and method for real-time spectral alignment for open-pa...
5786897 Method and device for measuring pattern coordinates of a pattern ...
5784202 Apparatus for isometrically splitting beams
5784160 Non-contact interferometric sizing of stochastic particles
5781298 Light mixing technique for isolation and amplification of laser s...
5781304 Laser ultrasonics-based material analysis system and method
5777741 Method and apparatus for optical interferometric measurements wit...
5777740 Combined interferometer/polarimeter
5777747 Process for positioning a mask relative to a workpiece and device...
5777739 Endpoint detector and method for measuring a change in wafer thic...
5774224 Linear-scanning, oblique-viewing optical apparatus
5774219 Reflection-type optical encoder with light receiving array
5771098 Laser interferometric lithographic system providing automatic cha...
5771096 Method of obtaining information
5767972 Method and apparatus for providing data age compensation in an ...
5764361 Interferometer, adjusting method therefor, stage apparatus having...
5764360 Electro-optical measuring device for absolute distances
5764359 Laser linewidth measuring apparatus utilizing stimulated brilloui...
5760904 Method and system for inspecting a surface of an object with lase...
5760903 Light measuring apparatus
5757491 Laser interferometer system for straightness measurements
5757487 Methods and apparatus for distributed optical fiber sensing of st...
5754294 Optical micrometer for measuring thickness of transparent wafers
5754293 Apparatus for the simultaneous acquisition of high bandwidth info...
 
Sign InRegister
Username  
Password   
forgot password?