| Patent No. | Patent Title: |
| 4925307 | Apparatus and method for the spectrochemical analysis of liquids ... |
| 4826322 | Encapsulated motion transducer |
| 4824254 | Alignment marks on semiconductor wafers and method of manufacturi... |
| 4808000 | Positioning device and method |
| 4802757 | System for determining the attitude of a moving imaging sensor pl... |
| 4801204 | Method and apparatus for measuring the turbidity of liquid media |
| 4798465 | Particle size detection device having high sensitivity in high mo... |
| 4796998 | Method for mobile survey of road surface |
| 4792233 | Flow cell for particle scanner |
| 4792227 | Apparatus for measuring the refractive index of a substrate for a... |
| 4792232 | Method and apparatus for detection of undesirable surface deformi... |
| 4790653 | Housing for a flow cytometry apparatus with particle unclogging f... |
| 4791461 | Portable analyzer |
| 4789242 | Optical apparatus for detecting the position of an object |
| 4787740 | Apparatus and method for determining crystal orientation |
| 4787742 | Direct finger reading |
| 4786177 | Method and apparatus for measuring the weft or mesh serial positi... |
| 4784494 | Method and apparatus for detecting universal and selectively ... |
| 4784491 | System to protect optics against dirty environments |
| 4784485 | Contact lens zonometer |
| 4781465 | Device for detecting road surface condition |
| 4781459 | Apparatus for measuring the amount of minute particles contained ... |
| 4781455 | Method for measuring optical strain and apparatus therefor |
| 4779980 | Atmospheric optical calibration system |
| 4778275 | Method of aligning a mask and a substrate relative to each other ... |
| 4778273 | Photoelectric measuring system |
| 4778271 | Photoeletric type measuring method and device |
| 4775235 | Optical spot scanning system for use in three-dimensional object ... |
| 4775236 | Laser based roundness and diameter gaging system and method of us... |
| 4773760 | Procedure and means for measuring the thickness of a film-like or... |
| 4772124 | Probe for a radiometer |
| 4772119 | Device for detecting a magnification error in an optical imaging ... |
| 4772127 | Surface inspection apparatus |
| 4772118 | Methods of and apparatus for measuring picosecond semiconductor l... |
| 4770529 | Alignment of optical waveguides |
| 4770528 | Optical system of a radiation thermometer |
| 4770532 | Equipment for optically measuring the height of step |
| 4770538 | Chopper wheel alignment device |
| 4770537 | Apparatus for optical measurement of the shape of oblong objects |
| 4767205 | Composition and method for hidden identification |
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