Bizarre Patents
A self defense weapon formed as a memo pad and which is easily held by a person's fingers, therefore making it possible to provide protection from a mugger and also to quickly and easily write a record or a message without failure of missing or forgetting significant information under a stressful situation.
PatentStorm News
Make the Most of Our Site
See this month's Top Inventors and Most Cited Patents.
Stay on top of the latest innovations by subscribing to an RSS feed.
Registered users: Manage your profile.
| Number | Title | Issue Date |
| 7755765 | Method and apparatus for inertial sensing via measurement of trapped orbit dynamics An inertial sensor consisting of an electrodynamic trap for suspending one or more charged particles and a readout device for measuring variations in the position or motion of the particles when the trap is subjected to acceleration forces. Particle may be measured ... | 07/13/2010 |
| 7474417 | Method for estimating at least one component placement position on a substrate as well as a device for carrying out such a method A method and a device are provided for estimating at least one component placement position on a substrate at which a component is to be placed. The component placement position is estimated on the basis of the position of at least one mark on the substrate. The sta... | 01/06/2009 |
| 7463362 | Digital signal processor-based detection system, method, and apparatus for optical tomography The present invention provides systems, methods and apparatuses that perform digital detection for use in optical tomography. Methods and systems are provided in which digital lock-in detection is performed using an algorithm that employs a phase-independent quadrat... | 12/09/2008 |
| 7460248 | Tissue imaging system A tissue imaging system (200) for examining the medical condition of tissue (290) has an illumination optical system (205), which comprises a light source (220), having one or more light emitters, beam shaping optics, and polarizing optic... | 12/02/2008 |
| 7461247 | Method for transitioning control of a peripheral device from a first device driver to a second device driver during operating system initialization A system for meeting demanding boot time requirements, such as those timing requirement mandated by vehicle telematics systems, is described. Current computer systems use expensive hardware like coprocessors to service requests, such as input/output requests, that h... | 12/02/2008 |
| 7460225 | Miniaturized source devices for optical and mass spectrometry Low-power, low flow-rate, portable, miniaturized plasma devices are provided. A portable, low-power, low flow-rate, miniaturized sample introduction device is also provided. The devices are inexpensive to make, have low operating cost and can be used with a variety ... | 12/02/2008 |
| 7461273 | Power distribution among servers A method of distributing power among servers is described includes calculating thermal multipliers of the servers, where the thermal multipliers represent recommended thermodynamic power consumption levels for the servers. In addition, the thermal multipliers of the... | 12/02/2008 |
| 7461287 | Elastic interface de-skew mechanism A mechanism for de-skewing and aligning data bits sent between two chips on an elastic interface. On the receiving end of an elastic interface, the eye of each data bit within a clock/data group is delayed by less than a bit time to align the eyes with the nearest c... | 12/02/2008 |
| 7457975 | Information processing apparatus with a function for low-power operation by controlling a power supply to a recording section of a recording medium and a computer individually An information processing apparatus which comprising a recording section for recording information in a removable recording medium, a switch, a computer, a power supply section for supplying power to the recording section and the computer, and an operating system wh... | 11/25/2008 |
| 7453584 | Examining a structure formed on a semiconductor wafer using machine learning systems A structure formed on a semiconductor wafer is examined by obtaining a first diffraction signal measured from the structure using an optical metrology device. A first profile is obtained from a first machine learning system using the first diffraction signal obtaine... | 11/18/2008 |
| 7454647 | Apparatus and method for skew measurement A skew measurement system and method wherein each of the signals among which the skew is to be determined is connected one at a time to a clock recovery loop. The locked state of the clock recovery loop is used as an indicator of the skew of the data signal relative... | 11/18/2008 |
| 7454650 | Microcontroller having a system resource prescaler thereon A microcontroller operating in synchronization with clock includes: an arithmetic unit operating in synchronization with the clock; an internal resource being connected to the arithmetic unit via a bus, and having at least a bus interface, and an internal circuit op... | 11/18/2008 |
| 7454631 | Method and apparatus for controlling power consumption in multiprocessor chip A system is provided for detecting when a temperature of a multiprocessor chip approaches an established threshold temperature indicating an imminent overheat condition. When the threshold temperature is reached, a number of active threads are idled in order to remo... | 11/18/2008 |
| 7450238 | Device and method for spectrally resolving detection of a sample Disclosed are an array and a method for the spectrally resolving detection of a sample (22) that is illuminated by means of an illuminating radiation (12) by detecting a sample radiation (24) emitted by the sample (22). Said array compris... | 11/11/2008 |
| 7450239 | Optical pulse evaluation device and in-service optical pulse evaluation device An optical pulse evaluation device and an in-service optical pulse evaluation device is disclosed which are capable of characteristics evaluation of an optical pulse itself or a sample launched therein in a relatively high bit-rate region. The optical pulse evaluati... | 11/11/2008 |
| 7450240 | Laser device coupled to a cavity by optical feedback for detecting gas traces A device of detection of gas in trace amounts by a semiconductor laser coupled to a resonant optical cavity containing a chemical species to be analyzed. The device comprises a resonant optical cavity containing a chemical species to be analyzed; a semiconductor las... | 11/11/2008 |
| 7446878 | Method and apparatus for improvement of spectrometer stability, and multivariate calibration transfer The present invention provides methods and apparatuses that can improve measurement accuracy in interferometers. The invention provides methods for determining digital compensation filters that measure a frequency response or responses to be compensated, and then de... | 11/04/2008 |
| 7446877 | All-fiber spectroscopic optical sensor A spectroscopic sensor apparatus based on an all optical fiber platform includes a light source, a sensor head, and a fiber acousto-optic tunable filter (FAOTF) based spectrometer. The target agent to be detected interacts with the optical field through the sensor h... | 11/04/2008 |
| 7447920 | Workload placement based on thermal considerations A method of workload placement among servers includes receipt of a workload request. The method also includes selection of a group of servers from a set of servers capable of performing the requested workload. In addition, server workload indexes, which are ratios o... | 11/04/2008 |
| 7447919 | Voltage modulation for increased reliability in an integrated circuit Techniques are disclosed for increasing reliability of an integrated circuit. In one embodiment, an integrated circuit includes core chip circuitry. The integrated circuit includes means for increasing a power supply voltage V provided to the core chip circuitry, su... | 11/04/2008 |
| 7446882 | Interferometer for determining characteristics of an object surface Disclosed is a system including: (i) an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference... | 11/04/2008 |
| 7444535 | Method and related apparatus for adjusting timing of memory signals A method and related apparatus for adjusting/calibrating timing of memory signals. In a preferred embodiment of the invention, reference signals of the same frequency and different phase are generated by a phase-lock loop. These reference signals are used to trigger... | 10/28/2008 |
| 7444526 | Performance conserving method for reducing power consumption in a server system A method for managing power in a data processing system having multiple components includes determining a power budget for the system. Activity levels during a forthcoming time interval are then predicted for each of the components. Using the predicted activity leve... | 10/28/2008 |
| 7443513 | Apparatus for optical measurement of an object An apparatus for optical measurement of an object, especially for measuring movement, is provided, which includes an interferometer for measuring movements along the measurement beam of the interferometer, as well as a confocal auto-focus microscope. The interferome... | 10/28/2008 |
| 7441135 | Adaptive dynamic buffering system for power management in server clusters A system, method and computer program product for managing power consumption in a system comprising at least two computing devices. The at least two computing devices are organized as part of active computing device group or a ready computing device group, the ready... | 10/21/2008 |
| 7440113 | Littrow interferometer An apparatus and method for measuring displacement includes a light beam directed to an interferometer core that splits the light beam into first and second component beams. The first component beam is directed to a diffraction grating at approximately a Littrow ang... | 10/21/2008 |
| 7440117 | Highly-sensitive displacement-measuring optical device Micron-scale displacement measurement devices having enhanced performance characteristics are disclosed. One embodiment of a micron-scale displacement measurement device includes a phase-sensitive reflective diffraction grating for reflecting a first portion of an i... | 10/21/2008 |
| 7440116 | Surface profiling apparatus with reference calibrator and method of calibrating same A broad band surface profiling apparatus including a reference calibrator for calibrating the apparatus to compensate for surface features of the reference surface. A user is instructed to conduct calibration measurement operations using a calibration sample having ... | 10/21/2008 |
| 7436519 | System and method for interferometer non-linearity compensation A method for non-linearity compensating interferometer position data generated from a measurement signal includes generating a first set of non-linearity parameters based on received digital position values. The method includes sensing whether a low velocity conditi... | 10/14/2008 |
| 7436521 | Optical measuring apparatus and operating method for imaging error correction in an optical imaging system A measuring apparatus for optical, for example interferometric, measurement of an optical imaging system, imaging of a useful pattern in an imaging operation, including a device for production of radiation information, for example interference information, which is ... | 10/14/2008 |
| 7434073 | Frequency and voltage scaling architecture A method and apparatus for scaling frequency and operating voltage of at least one clock domain of a microprocessor. More particularly, embodiments of the invention relate to techniques to divide a microprocessor into clock domains and control the frequency and oper... | 10/07/2008 |
| 7433024 | Range mapping using speckle decorrelation A method for mapping includes projecting a primary speckle pattern from an illumination assembly into a target region. A plurality of reference images of the primary speckle pattern are captured at different, respective distances from the illumination assembly in th... | 10/07/2008 |
| 7433051 | Determination of lithography misalignment based on curvature and stress mapping data of substrates Provided are methods to be carried out prior to, while, and/or after performing a photolithographic process to a wafer that involve wafer misalignment assessment. The method involves obtaining curvature and/or deformation information of a surface of the wafer over a... | 10/07/2008 |
| 7433048 | Interferometer systems for measuring displacement and exposure systems using the same Interferometer systems for measuring displacement include a displacement interferometer. This interferometer includes a displacement converter responsive to a measuring beam of light. The displacement converter is configured to transform movement thereof in a direct... | 10/07/2008 |
| 7433044 | Sagnac fourier transform spectrometer having improved resolution A Fourier transform spectrometer based on a modified Sagnac interferometer is described. The instrument uses one or more gratings as dispersive elements to greatly improve the spectral resolution, and in-line optics to match the beam size in the interferometer to op... | 10/07/2008 |
| 7428052 | Optical tomographic apparatus An optical tomographic apparatus is provided and includes a light source portion, and an interferometer including a probe. A vicinity of a fore-end of a probe is provided with a concave mirror and a portion spaced apart from the concave mirror by a distance therebet... | 09/23/2008 |
| 7428057 | Interferometer for determining characteristics of an object surface, including processing and calibration Disclosed is a system including: (i) an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference... | 09/23/2008 |
| 7428059 | Measurement method and apparatus, exposure apparatus, and device manufacturing method A measurement method measures a wavefront aberration of a target optical system using an interference pattern formed by lights from first and second image side slits. The first image side slit has a width equal to or smaller than a diffraction limit of the target op... | 09/23/2008 |
| 7428048 | Imaging elastic scattering spectroscopy An apparatus for image elastic scattering spectroscopy is disclosed that is comprised of a light source for generating polarized light. Means are provided to convey the polarized light to a target. A collector receives light reflected from the target. A detector is ... | 09/23/2008 |
| 7428054 | Micro-optical sensor system for pressure, acceleration, and pressure gradient measurements A micro-optical fiber tip based sensor system for pressure, acceleration, and pressure gradient measurements in a wide bandwidth, the design of which allows for multiplexity of the input side of the system is based on micro-electromechanical fabrication techniques. ... | 09/23/2008 |
