U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Patent No. 6725510

Inclining coffin

A coffin, for allowing inclination for display of a deceased person in a natural position.

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Examiner: Connolly, Patrick


Primary examiner statistics: 195 patents; average approval time: 205 days
Assistant examiner statistics: 465 patents; average approval time: 464 days

Patents as Primary Examiner (view all)

Patent No. Patent Title:
7755765 Method and apparatus for inertial sensing via measurement of trap...
7474417 Method for estimating at least one component placement position o...
7463362 Digital signal processor-based detection system, method, and appa...
7460248 Tissue imaging system
7461247 Method for transitioning control of a peripheral device from a fi...
7460225 Miniaturized source devices for optical and mass spectrometry
7461273 Power distribution among servers
7461287 Elastic interface de-skew mechanism
7457975 Information processing apparatus with a function for low-power op...
7453584 Examining a structure formed on a semiconductor wafer using machi...
7454647 Apparatus and method for skew measurement
7454650 Microcontroller having a system resource prescaler thereon
7454631 Method and apparatus for controlling power consumption in multipr...
7450238 Device and method for spectrally resolving detection of a sample
7450239 Optical pulse evaluation device and in-service optical pulse eval...
7450240 Laser device coupled to a cavity by optical feedback for detectin...
7446878 Method and apparatus for improvement of spectrometer stability, a...
7446877 All-fiber spectroscopic optical sensor
7447920 Workload placement based on thermal considerations
7447919 Voltage modulation for increased reliability in an integrated cir...
7446882 Interferometer for determining characteristics of an object surfa...
7444535 Method and related apparatus for adjusting timing of memory signa...
7444526 Performance conserving method for reducing power consumption in a...
7443513 Apparatus for optical measurement of an object
7441135 Adaptive dynamic buffering system for power management in server ...
7440113 Littrow interferometer
7440117 Highly-sensitive displacement-measuring optical device
7440116 Surface profiling apparatus with reference calibrator and method ...
7436519 System and method for interferometer non-linearity compensation
7436521 Optical measuring apparatus and operating method for imaging erro...
7434073 Frequency and voltage scaling architecture
7433024 Range mapping using speckle decorrelation
7433051 Determination of lithography misalignment based on curvature and ...
7433048 Interferometer systems for measuring displacement and exposure sy...
7433044 Sagnac fourier transform spectrometer having improved resolution
7428052 Optical tomographic apparatus
7428057 Interferometer for determining characteristics of an object surfa...
7428059 Measurement method and apparatus, exposure apparatus, and device ...
7428048 Imaging elastic scattering spectroscopy
7428054 Micro-optical sensor system for pressure, acceleration, and press...

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
7366890 Method for switching to a service mode of operation in response t...
7365858 Systems and methods for phase measurements
7362444 Interferometers for optical coherence domain reflectometry
7359061 Method and apparatus for providing polarization insensitive signa...
7349101 Lithographic apparatus, overlay detector, device manufacturing me...
7340618 System and method for regulating system power by controlling memo...
7340619 System and method for circulating power usage information on a cl...
7321973 System for controlling power to a system part using a control uni...
7313706 System and method for managing power consumption for a plurality ...
7293183 System for storing working context in a non-volatile memory while...
7293181 Use of one voltage regulator module to support two processors to ...
7280224 Interferometry systems and methods of using interferometry system...
7274464 Position measuring device
7275164 System and method for fencing any one of the plurality of voltage...
7272711 Recording/reproducing apparatus and method for updating firmware ...
7268887 Overlapping common-path interferometers for two-sided measurement
7266714 Method an apparatus for adjusting the time of a clock if it is de...
7259867 Method and device for analyzing a light intensity distribution ov...
7259859 Terahertz modulation spectrometer
7259868 Method for determining the optical nonlinearity profile of a mate...
7257729 System and method for processing an instruction according to a cl...
7254721 System and method for controlling an intergrated circuit to enter...
7251041 Spatial filtering in interferometry
7248372 Technologies for measuring thickness of an optical disc
7249270 Method and apparatus for placing at least one processor into a po...
7240225 System and method for throttling power in one or more information...
7236252 System and apparatus for measuring displacements in electro-activ...
7236254 Exposure apparatus with interferometer
7231531 Personal electronics device with a dual core processor
7231530 System and method for saving power in a wireless network by reduc...
7230718 Simultaneous phase-shifting fizeau interferometer
7230717 Pixelated phase-mask interferometer
7230720 Film thickness measuring method of member to be processed using e...
7230719 High sensitivity scanning probe system
7224466 Compact multi-axis interferometer
7224464 Fourier-transform spectrometers
7224463 Resolving quadrature fringes of interferometer signals in real ti...
7222248 Method of switching voltage islands in integrated circuits when a...
7222250 Display unit and power save controller
7221458 Method for measuring the microrelief of an object and optical cha...
 
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