U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Examiner: Wells, Nikita


Primary examiner statistics: 1666 patents; average approval time: 1665 days
Assistant examiner statistics: 282 patents; average approval time: 799 days

Patents as Primary Examiner (view all)

Patent No. Patent Title:
8110794 Soft ablative desorption method and system
8110814 Ion sources, systems and methods
8106369 Electron beam web irradiation apparatus and process
8106352 Multi-dimensional ion mobility spectrometry methods and apparatus
8106366 Ion beam control apparatus and method
8108942 Probe microscope
8106353 Apparatus and method of photo fragmentation
8101929 Diffraction free, self-bending airy wave arrangement
8101931 RF screen assembly for microwave powered UV lamps
8101921 Apparatus and method for inducing controllable jets in liquids
8097846 Metrology and 3D reconstruction of devices in a wafer
8097860 Multiple nozzle gas cluster ion beam processing system and method...
8091143 Atomic force microscopy probe
8089052 Ion source with adjustable aperture
8084751 Detection arrangements in mass spectrometers
8076227 Electroactive polymers for lithography
8071943 Mask inspection apparatus and image creation method
8074291 Harmonic correcting controller for a scanning probe microscope
8071955 Magnetic deflector for an electron column
8071958 Ion implantation device and a method of semiconductor manufacturi...
8071954 Hybrid phase plate
8074293 Defective product inspection apparatus, probe positioning method ...
8071964 System and method of performing uniform dose implantation under a...
8071942 Sample holder apparatus to reduce energy of electrons in an analy...
8067759 Radiation protective vest
8067757 Extreme ultraviolet light source apparatus and method of adjustin...
8063361 Ion mobility based separation methods and apparatus
8058626 Method and apparatus for modifying a ribbon-shaped ion beam
8058612 Microirradiators and methods of making and using same
8047055 Size segregated aerosol mass concentration measurement with inlet...
8051493 Probe microscopy and probe position monitoring apparatus
8044343 Gas analyzer
8039824 Canister for final repository of spent nuclear fuel
8039795 Ion sources for improved ionization
8035088 Device, apparatus and methods for mass spectrometry
8030625 Electron beam writing method, fine pattern writing system, method...
8030626 Apparatus and method for charged-particle beam writing
8030628 Pulse modifier, lithographic apparatus and device manufacturing m...
8030613 RF power supply for a mass spectrometer
8030622 Specimen holder, specimen inspection apparatus, and specimen insp...

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
6621089 Reticle-focus detector, and charged-particle-beam microlithograph...
6596988 Separation media, multiple electrospray nozzle system and method
6593585 Lithographic projection apparatus with positioning system for use...
6593566 Method and apparatus for particle acceleration
6580084 Accelerator system
6576909 Ion generation chamber
6576902 Correction method of scanning electron microscope
6573492 Mass spectrometric analysis method and apparatus using the method
6573495 High capacity ion cyclotron resonance cell
6570173 Device for disinfecting water flowing through a sanitary facility
6570164 Resolution enhancement device for an optically-coupled image sens...
6570171 Ion implanter
6566654 Inspection of circuit patterns for defects and analysis of defect...
6566655 Multi-beam SEM for sidewall imaging
6563111 Integrated monolithic microfabricated electrospray and liquid ...
6559457 System and method for facilitating detection of defects on a wafe...
6559459 Convergent charged particle beam apparatus and inspection method ...
6559463 Mask pattern transfer method, mask pattern transfer apparatus usi...
6559610 Continuous wave electron-beam accelerator and continuous wave ele...
6559458 Measuring instrument and method for measuring features on a subst...
6555815 Apparatus and method for examining specimen with a charged partic...
6555832 Determining beam alignment in ion implantation using Rutherford B...
6555813 Probes with hydrophobic coatings for gas phase ion spectrometers
6552350 System and method for providing a lithographic light source for a...
6548809 Electromagnetic device for production of cold neutral atoms
6545436 Magnetic containment system for the production of radiation from ...
6545273 Use of multiple tips on AFM to deconvolve tip effects
6541766 Ion trap mass spectrometry and ion trap mass spectrometer
6541782 Electron beam photolithographic process
6534425 Mask design and method for controlled profile fabrication
6531698 Particle-optic illuminating and imaging system with a condenser-o...
6531705 Container for storing and shipping radioactive materials
6526909 Biased ion beam deposition of high density carbon
6528787 Scanning electron microscope
6524803 Deconvolution method and apparatus for analyzing compounds
6522056 Method and apparatus for simultaneously depositing and observing ...
6515426 Ion beam processing apparatus and method of operating ion source ...
6512226 Method of and apparatus for selective collision-induced dissociat...
6512333 RF-powered plasma accelerator/homogenizer
6507142 Plume shield for ion accelerators
 
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