U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Patent No. 6725510

Inclining coffin

A coffin, for allowing inclination for display of a deceased person in a natural position.

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Examiner: Stafira, Michael P.


Primary examiner statistics: 657 patents; average approval time: 657 days
Assistant examiner statistics: 381 patents; average approval time: 726 days

Patents as Primary Examiner (view all)

Patent No. Patent Title:
7986404 Inspection system employing illumination that is selectable over ...
7576862 Measuring time dependent fluorescence
7522273 Apparatus and method for measuring an optical characteristic with...
7463348 Rail vehicle mounted rail measurement system
7463359 Plasmon tomography
7453561 Method and apparatus for inspecting foreign particle defects
7453563 Device and method for detecting scratches
7453555 Aggregometer with near ultraviolet light source
7453572 Method and apparatus for continuous measurement of the refractive...
7450223 Sample analyzer
7446889 Method of evaluating film thickness, method of detecting polishin...
7446875 Apparatus and method for acquiring time-resolved measurements uti...
7446871 Method and apparatus for real-time polarization difference imagin...
7446866 Apparatus and method for inspecting pattern
7446865 Method of classifying defects
7446870 Method for verification of particles having a sensor area and sen...
7443507 Surface plasmon resonance sensor
7443501 Light guide plate measurement apparatus
7443499 Method for measuring the sagging of a glass panel
7443492 Device and method for testing lens modules
7436504 Non-destructive testing and imaging
7436523 Eyeglass frame measurement apparatus
7433797 Method for verifying scan precision of a laser measurement machin...
7433033 Inspection method and apparatus using same
7430043 Turbidimeter improvements
7428047 Time-delay integration in a flow cytometry system
7426031 Method and apparatus for inspecting target defects on a wafer
7423741 Method for visualizing a mark on a spectacle lens
7423754 Web planarity gauge and method
7423757 Modulated reflectance measurement system with multiple wavelength...
7423747 Floating cuvette for lens inspection
7417720 Lighting optical machine and defect inspection system
7417721 Defect detector and defect detecting method
7414710 Device for checking banknotes
7408647 Surface plasmon resonance sensor device
7405827 Gas content measuring apparatus and method
7403272 Method and device for the detection of counterfeit documents and ...
7403278 Surface inspection apparatus and surface inspection method
7403279 Information recording medium examining apparatus and method
7403296 Method and apparatus for noncontact relative rail displacement, t...

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
6580508 Method for monitoring a semiconductor wafer in a chemical mechani...
6538739 Bubble diagnostics
6462809 Refractomer and method for qualitative and quantitative measureme...
6441896 Method and apparatus for measuring spatial uniformity of radiatio...
6421121 Method and apparatus for rapid particle identification utilizing ...
6417905 Method for fabricating a liquid crystal cell
6411370 Optical system and method for measuring distance
6411766 Devices for protecting and routing optical fibers in a rack
6407373 Apparatus and method for reviewing defects on an object
6407813 Measurement systems and methods for determining component particl...
6407804 Assembly for detecting the superficial structures of fingers and/...
6404488 Photometer
6404493 Dual large angle light scattering detection
6404495 System and method for molecular sample measurement
6404497 Polarized light scattering spectroscopy of tissue
6404496 Inspection of molded discs with polarizers and display screen
6402388 Optical connector
6400455 Observation apparatus
6392750 Use of scattered and/or transmitted light in determining characte...
6392745 Method and apparatus for the fast detection of surface characteri...
6388749 Monitoring apparatus
6388747 Inspection method, apparatus and system for circuit pattern
6384911 Apparatus and method for detecting accuracy of drill holes on a p...
6381021 Method and apparatus for measuring reflectivity of deposited film...
6381020 Optical system
6377347 Belt edge sensor
6377343 Vessel system for monitoring of fluid samples
6373561 Device and method for detecting depth and color information of an...
6373572 Method and apparatus for making and using an improved fiducial fo...
6373577 Surface plasmon resonance sensor for the simultaneous measurement...
6373049 Knock mode scanning near-field optical microscope
6369889 Method and devices for checking container glass
6366350 Apparatus for transmitting light source to a light detector
6366352 Optical inspection method and apparatus utilizing a variable angl...
6366351 Apparatus for detecting defects in wood processed by a planer
6366349 Apparatus for aligning optical elements in response to the displa...
6362882 Reticle projection system for video inspection apparatus
6362891 Powder analysis
6362889 Imaging system for high-speed paper webs
6362890 Method and device for checking the liquid take up of a test layer...
 
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