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Examiner: Nguyen, Kiet T


Primary examiner statistics: 314 patents; average approval time: 317 days
Assistant examiner statistics: 0 patents; average approval time: N/A

Patents as Primary Examiner (view all)

Patent No. Patent Title:
8188426 Quadropole mass spectrometer
8168959 Reticle protection member, reticle carrying device, exposure devi...
8164071 Electron beam source and method of manufacturing the same
8164056 Method for operating three-dimensional RF ion traps with high ion...
8164054 Mass analysis method and mass analysis system
8164073 Method for the inactivation of pathogens in donor blood, blood pl...
8164076 Extreme ultraviolet light source apparatus and method of generati...
8158927 Multiple laminar flow-based particle and cellular separation with...
8158960 Laser produced plasma EUV light source
8155892 Means for identifying a strain isolated from a clinical sample at...
8153964 Ultrasound ionization mass spectrometer
8153963 Mass spectrometer
8153966 Electrode unit and charged particle beam device
8151368 Dynamic mode AFM apparatus
8148698 Charged particle beam writing apparatus
8144333 Optical fiber structure monitoring and analysis
8138487 System, method and apparatus for droplet catcher for prevention o...
8134136 Ex-situ removal of deposition on an optical element
8117668 Optical scanning probe
8110815 Vapor delivery to devices under vacuum
8097845 Focused analyte spray emission apparatus and process for mass spe...
8076651 Specimen stage apparatus and specimen stage positioning control m...
8035082 Projection electron beam apparatus and defect inspection system u...
8008622 Electron beam apparatus and method of generating an electron beam...
8008620 Substrate for mass spectrometry and mass spectrometry method
8003958 Apparatus and method for doping
7999240 Method and apparatus for specimen fabrication
7989766 Sample inspection apparatus
7989783 Nanolithography system
7985956 Fluid treatment system
7982186 Method and apparatus for obtaining images by raster scanning char...
7982200 Hadron treatment planning with adequate biological weighting
7982196 Method for modifying a material layer using gas cluster ion beam ...
7977654 Writing apparatus and writing method
7977652 Optical heater for cryogenic ion implanter surface regeneration
7973281 Semiconductor substrate, substrate inspection method, semiconduct...
7973299 System and method for providing a suspended personal radiation pr...
7973293 Implantation quality improvement by xenon/hydrogen dilution gas
7968844 Hole inspection apparatus and hole inspection method using the sa...
7968857 Apparatus and method for partial ion implantation using atom vibr...

Patents as Assistant Examiner

Patent No. Patent Title:
No patents.
 
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