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Patent No. 5500234

Crispy Chip Sandwich and Process of Producing a Sandwich Product

A food product comprising a multilayer cookie or snack having outer layers formed from a crispy type edible food product such as a potato chip or corn chip, etc. with an intermediate marshmallow layer being in contact with the inner surface of each crispy chip and one or more filler substances.

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McAndrews, Kevin


Primary examiner statistics: 0 patents; average approval time: 0 days
Assistant examiner statistics: 143 patents; average approval time: 607 days

Patents as Assistant Examiner


1        
NumberTitleIssue Date
5156984Manufacturing method for a Bi-CMOS by trenching
A manufacturing method for a Bi-CMOS by trenching which is allowed to manufacture the bipolar celement and CMOS element simultaneously on one substrate by trench etching, comprising the processes of growing an oxide layer, forming N+ buried la...
10/20/1992
5086011Process for producing thin single crystal silicon islands on insulator
A semiconductor fabrication process uses an epitaxial layer as an etch stop in a plasma etch process. In one embodiment, mechanical stops and an epitaxial layer are used in combination for stopping precisely at a desired end point....
02/04/1992
5084399Semi conductor device and process for fabrication of same
In a contact type image sensor prepared by disposing a plurality of sandwich type photoelectric conversion elements each of which is obtained by sandwiching an amorphous semiconductor layer as a photoelectric conversion layer between a metal electrode and...
01/28/1992
4996166Process for fabricating a heterojunction bipolar transistor
A heterojunction bipolar transistor includes a base layer and a wide bandgap emitter layer. A portion of the base layer is exposed, a base electrode is formed thereon and the active region of the emitter-base junction is limited inside a semiconductor bod...
02/26/1991
4994407Radiation hardened field oxides for NMOS and CMOS-bulk and process for forming
The field oxide surrounding an NMOS device or the field oxide around the NMOS device and between the NMOS and PMOS devices in CMOS is split or notched to make at least one thin field oxide region under which a degenerative P+ region is formed in the subst...
02/19/1991
4975390Method of fabricating a semiconductor pressure sensor
Herein disclosed is a semiconductor pressure sensor and a method of manufacture. The sensor includes a plate having a recess in its main surface. A diaphragm has a lower surface therof bonded to a first main surface of the plate and formed so as to have a...
12/04/1990
4968643Method for fabricating an activatable conducting link for metallic conductive wiring in a semiconductor device
A conducting link is disposed in an insulating layer of a semiconductor device in combination with a plurality of wirings of the device which are electrically separated from each other. The conducting link is selectively activated to provide the wirings w...
11/06/1990
4965219Method for the manufacturing of insulated gate field effect transistors (IGFETS) having a high response speed in high density integrated circuits
The method involves the formation above the substrate of regions of epitaxial type automatically aligned with the gate electrode and designed to form the source and drain regions of the transistor. These regions are doped by ion implantation using a compa...
10/23/1990
4962053Bipolar transistor fabrication utilizing CMOS techniques
Disclosed is a bipolar transistor and a method of fabrication thereof compatible with MOSFET devices. A transistor intrinsic base region (54) is formed in the face of a semiconductor well (22), and covered with a gate oxide (44). The gate oxide (44) is op...
10/09/1990
4962052Method for producing semiconductor integrated circuit device
A method for producing a memory LSI having in its peripheral circuitry an MISFET of LDD structure and a vertical type bipolar transistor is disclosed. More particularly, an impurity for forming a low impurity concentration region of the said MISFET of LDD...
10/09/1990
4960729Integrated circuits and a method for manufacture thereof
A technique for providing a radiation formable conductive link in an integrated circuit comprising the steps of: depositing a plurality of aluminum conductors on an exposed surface of an otherwise completed integrated circuit, and forming a bridge of amor...
10/02/1990
4954457Method of making heterojunction bipolar transistors
Heterojunction bipolar transistor technology employing in a body wherein a larger area base electrode over a buried electrode has above it a smaller area electrode, an overhang capability on the portion of the smaller area electrode that operates to mask ...
09/04/1990
4954455Semiconductor memory device having protection against alpha strike induced errors
The invention comprises an improved bipolar memory device having enhanced protection against the effects of alpha particles comprising at least one memory cell having a buried layer forming at least a portion of the collector of one of the transistors in ...
09/04/1990
4954456Fabrication method for high speed and high packing density semiconductor device (BiCMOS)
A fabrication method for a high speed and high packing density semiconductor device (BiCMOS) in which high speed polysilicon self-aligned bipolar transistors and high packing density CMOS are contained on the same wafer in such a manner that simplicity in...
09/04/1990
4948752Method of making sagfets on buffer layers
A composite buffer layer is formed with a layer of GaAs on a semi-insulating GaAs substrate. Next a short period superlattice is formed followed by another GaAs layer, whereon is formed a first AlGaAs layer having a first mole fraction of Al and a second ...
08/14/1990
4948757Method for fabricating three-dimensional microstructures and a high-sensitivity integrated vibration sensor using such microstructures
A method for preferentially etching phosphosilicate glass to form a micromechanical structure includes forming a layer of phosphosilicate glass on a substrate and opening at least one via in the phosphosilicate glass layer. A layer of material which is pa...
08/14/1990
4946798Semiconductor integrated circuit fabrication method
In a semiconductor integrated circuit fabrication method, isolated regions are in a silicon substrate, which is then covered with polysilicon, a passive base region is then formed, the polysilicon is selectively oxidized, the unoxidized polysilicon is the...
08/07/1990
4944682Method of forming borderless contacts
A method of forming semi-conductor devices components wherein there are at least two exposed conducting regions having passivating material overlying said regions. The passivating material is subject to etching by a given etchant. At least one, but less t...
07/31/1990
4940671High voltage complementary NPN/PNP process
A process is disclosed for forming high-performance high-voltage PNP transistors in a conventional monolithic, planar, PN junction isolated integrated circuit that contains high-performance NPN transistors. The process permits independently optimizing the...
07/10/1990
4933300Process for forming multilayer thin film
A superlattice film is formed by introducing a mixture of a first gas reactant capable of only plasma-excited chemical reaction and a second gas reactant capable of both plasma-excited chemical reactions into a reaction chamber, discontinuously carrying o...
06/12/1990
4933295Method of forming a bipolar transistor having closely spaced device regions
A method of forming a bipolar transistor comprising the steps of forming a base region in a semiconductor structure and disposing an emitter region on a surface of a first portion of the base region, the emitter region having upper and side surfaces. An a...
06/12/1990
4929570Selective epitaxy BiCMOS process
A process for fabricating both bipolar and complementary field effect transistors in an integrated circuit is disclosed. The process begins with a structure having a P type substrate 10, an N type epitaxial layer 15, and an intervening N type buried layer...
05/29/1990
4927471Semiconductor substrate comprising wafer substrate and compound semiconductor layer
A semiconductor substrate including a top epitaxial compound layer comprising: a single-crystalline semiconductor wafer substrate; a strained layer superlattice (SLS) structure layer having a lattice constant varying from that of the wafer substrate to th...
05/22/1990
4927785Method of manufacturing semiconductor devices
A method of manufacturing semiconductor devices is set forth using reactive ion plasma etching in which an optical grating is formed to etch underlying regions, such as dielectric material, semiconductor material, or alternate layers of different semicond...
05/22/1990
4927784Simultaneous formation of via hole and tube structures for GaAs monolithic microwave integrated circuits
A method of simultaneously forming recesses for via holes and tube structures in a substrate is provided in a common etching step by defining a mask pattern for the via hole as a single aperture and by defining a mask pattern for the tub structure as a pl...
05/22/1990
4921811Semiconductor integrated circuit device and a method for manufacturing the same
An improved arrangement is provided for forming a bipolar transistor on a substrate with CMOS elements. All of the transistors (i.e., the bipolar, P-MOS and N-MOS) are formed in regions having gradually decreasing impurity concentrations from the surface ...
05/01/1990
4920075Method for manufacturing a semiconductor device having a lens section
A method for manufacturing a semiconductor device with a lens section. A semiconductor element is formed in a semiconductor substrate and a transparent layer is formed on this semiconductor element. The transparent layer is patterned to form the lens sect...
04/24/1990
4918032Method for fabricating three-dimensional microstructures and a high-sensitivity integrated vibration sensor using such microstructures
A method for preferentially etching phosphosilicate glass to form a micromechanical structure includes forming a layer of phosphosilicate glass on a substrate and opening at least one via in the phosphosilicate glass layer. A layer of material which is pa...
04/17/1990
4918026Process for forming vertical bipolar transistors and high voltage CMOS in a single integrated circuit chip
A process is used to form in a common substrate a PMOS transistor of the lightly doped drain (LDD) type, an NMOS transistor of the LDD type and a vertical n-p-n bipolar transistor. In particular: the steps used to form an n-type well for the PMOS transist...
04/17/1990
4918030Method of forming light-trapping surface for photovoltaic cell and resulting structure
An improved textured surface of a photovoltaic device is provided by an anisotropic etching process in which pyramidal structures are formed on a silicon surface having a (100) crystallographic orientation. An aqueous solution of an alkali metal hydroxide...
04/17/1990
4916083High performance sidewall emitter transistor
A novel vertical bipolar device endowed with a lithography-independent tightly controlled submicron-wide emitter. In one embodiment, the emitter is contacted by a self-aligned conductive sidewall linked up to a horizontal conductive link. The extrinsic ba...
04/10/1990
4914048Method of making Bicmos devices
A bipolar transistor structure (1) which can be used in an integrated circuit where bipolar (1) and CMOS transistors (2,3) are formed simultaneously on one substrate. In integrated circuit form the material, for example polycrystalline silicon, used for t...
04/03/1990
4914055Semiconductor antifuse structure and method
A method for forming an array of antifuse structures on a semiconductor substrate which previously has had CMOS devices fabricated thereupon up to first metallization. A fuse structure is formed as a sandwich by successively depositing a bottom layer of T...
04/03/1990
4912066Make-link programming of semiconductor devices using laser-enhanced thermal breakdown of insulator
A semiconductor device is programmed by a laser beam which causes an insulator between two conductors on a silicon substrate to be permanently altered, as by breakdown of the insulator. The conductors may be metals such as aluminum or tungsten, and the in...
03/27/1990
4910170Method of manufacturing semiconductor device
In the invention, the width of the emitter contact layer is determined in accordance with the width of a first side wall, and the junction distance between a base contact layer and the emitter contact layer is determined in accordance with the width of a ...
03/20/1990
4907974Method of growing a semiconductor device structure
A semiconductor device includes a plurality of crystalline layers successively disposed directly on a substrate or on a buffer layer on the substrate and a getter layer comprising a metal of high activity disposed between the substrate or the buffer layer...
03/13/1990
4904612Method for manufacturing a planar, self-aligned emitter-base complex
A method for the manufacture of a planar, self-aligned emitter-base complex, whereby a semiconductor layer structure standard for hetero-bipolar transistors is first grown on a substrate, the base regions are subsequently etching through a mask technique ...
02/27/1990
4902633Process for making a bipolar integrated circuit
A bipolar integrated circuit requiring less silicon area is provided by the use of a three layer epitaxy on top of a substrate. The first epitaxial layer is of the same conductivity type as the substrate and adds additional height to the substrate surroun...
02/20/1990
4892837Method for manufacturing semiconductor integrated circuit device
Disclosed is a method of producing a bipolar transistor which enables an external base region, an intrinsic base region and an emitter region to be formed in self-alignment with respect to the base electrode. More specifically, the method comprises the st...
01/09/1990
4892840EPROM with increased floating gate/control gate coupling
Disclosed is a floating gate memory array having high-speed programming capabilities. Diffused buried bit lines (14) are formed spaced apart in a semiconductor, forming conduction channels therebetween. Dielectric-filled trenches (24) are formed between t...
01/09/1990
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