U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Examiner: Geisel, Kara E


Primary examiner statistics: 278 patents; average approval time: 280 days
Assistant examiner statistics: 2 patents; average approval time: N/A

Patents as Primary Examiner (view all)

Patent No. Patent Title:
8189192 Volume phase grating spectrometers and related methods and system...
8189179 System and method for hyperspectral and polarimetric imaging
8189189 LED sensor for process control
8189191 Spectroscopic imaging microscopy
8184274 Measuring instrument and method for the measuring of properties o...
8179531 Shuttering and sealing device
8180142 Test fail analysis on VLSI chips
8180138 Method and system for inspection of containers
8174692 High spatial resolution imaging of a structure of interest in a s...
8174695 Arrayed micro-ring spectrometer system and method of use
8154721 Method of online predicting maintenance of an apparatus
8149400 Coded aperture snapshot spectral imager and method therefor
8149399 Methods and systems for simultaneous real-time monitoring of opti...
8149405 Color analysis system and method
8144326 Fabric whiteness guide
8139847 Defect inspection tool and method of parameter tuning for defect ...
8139208 Ultrasonic detection system and method for the detection of trans...
8135179 Systems, methods and devices for use in assessing fat and muscle ...
8125633 Calibration of a radiometric optical monitoring system used for f...
8125639 Temperature compensated spectroscope and optical apparatus
8125625 Hard copy re-emission color measurement system
8111938 System and method for fast approximate focus
8107069 Method and apparatus for conducting Raman spectroscopy
8102524 Degree-of-dispersion determination method for single-walled carbo...
8102525 Systems and methods for detecting chemical and biological substan...
8098374 Highly sensitive spectroscopic unit
8094306 Micro ring grating spectrometer with adjustable aperture
8094921 Method and system for remote rework imaging for part inconsistenc...
8090191 Method and apparatus for inspection and fault analysis
8089628 Pulsed-multiline excitation for color-blind fluorescence detectio...
8089626 Miniscule-size photo-spectrometer units
8089625 Time-resolved and wavelength-resolved spectroscopy for characteri...
8081310 Multimarking fibre-type fluorescence microscopic imaging method a...
8072586 Arrangement and method for focusing a multiplane image acquisitio...
8072602 Combination of reader and incubator
8073238 Mixed injection inspection system
8072595 Time correlation system and method
8068222 Method and apparatus for microlens array/fiber optic imaging
8068223 Spectroscopic module
8064052 Energy meter for mixed streams of combustible compounds

Patents as Assistant Examiner

Patent No. Patent Title:
7869029 Multiple wavelength light collimator and monitor
7599056 Method, structure, and apparatus for Raman spectroscopy
 
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